PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES |
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Influence of ion species on extraction characteristics of mixed ion beams |
Ao Xu(徐翱), Pingping Gan(甘娉娉)†, Xiang Wan(万翔), and Yuanjie Shi(石元杰) |
Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China |
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Abstract The spatial distributions of different kinds of ions are usually not completely the same in the process of extracting. In order to study the reason for the different characteristics of ion extraction, a simplified simulation model of Cu$^{+}$ and Cr$^{+}$ ions extraction process was established by 2D3V (two-dimensional in space and three-dimensional in velocity space) particle-in-cell (PIC) method. The effects of different extraction voltages from 0 V to 500 V on the density distribution of Cu$^{+}$ and Cr$^{+}$ ions and the change of plasma emission surface were analyzed. On the basis of this model, the ion density distribution characteristics of Cu$^{+}$ ions mixed with Li$^{+}$, Mg$^{+}$, K$^{+}$, Fe$^{+}$, Y$^{+}$, Ag$^{+}$, Xe$^{+}$, Au$^{+}$, and Pb$^{+}$ ions respectively under 200-V extraction voltage are further simulated, and it is revealed that the atomic mass of the ions is the key reason for different ion density distributions when different kinds of ions are mixed and extracted, which provides support for further understanding of ion extraction characteristics.
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Received: 17 April 2024
Revised: 24 June 2024
Accepted manuscript online:
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PACS:
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52.65.-y
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(Plasma simulation)
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52.65.Rr
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(Particle-in-cell method)
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29.25.-t
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(Particle sources and targets)
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29.25.Ni
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(Ion sources: positive and negative)
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Fund: Project supported by the Presidential Foundation of China Academy of Engineering Physics (Grant No. YZJJZQ2022016) and the National Natural Science Foundation of China (Grant No. 52207177). |
Corresponding Authors:
Pingping Gan
E-mail: pingping.0224@qq.com
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Cite this article:
Ao Xu(徐翱), Pingping Gan(甘娉娉), Xiang Wan(万翔), and Yuanjie Shi(石元杰) Influence of ion species on extraction characteristics of mixed ion beams 2024 Chin. Phys. B 33 095202
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