CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Superconductivity of bilayer titanium/indium thin film grown on SiO2/Si (001) |
Zhao-Hong Mo(莫钊洪)1,2, Chao Lu(路超)1, Yi Liu(刘毅)1, Wei Feng(冯卫)1, Yun Zhang(张云)1, Wen Zhang(张文)1, Shi-Yong Tan(谭世勇)1, Hong-Jun Zhang(张宏俊)1, Chun-Yu Guo(郭春煜)3, Xiao-Dong Wang(汪小冬)1, Liang Wang(王亮)1, Rui-Zhu Yang(杨蕊竹)1, Zhong-Guo Ren(任忠国)1, Xie-Gang Zhu(朱燮刚)1, Zhong-Hua Xiong(熊忠华)1, Qi An(安琪)2, Xin-Chun Lai(赖新春)4 |
1 Institute of Materials, China Academy of Engineering Physics, Jiangyou 621908, China; 2 Department of Engineering and Applied Physics, School of Physical Sciences, University of Science and Technology of China, Hefei 230026, China; 3 Zhejiang University, Hangzhou 310058, China; 4 China Academy of Engineering Physics, Mianyang 621000, China |
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Abstract Bilayer superconducting films with tunable transition temperature (Tc) are a critical ingredient to the fabrication of high-performance transition edge sensors. Commonly chosen materials include Mo/Au, Mo/Cu, Ti/Au, and Ti/Al systems. Here in this work, titanium/indium (Ti/In) bilayer superconducting films are successfully fabricated on SiO2/Si (001) substrates by molecular beam epitaxy (MBE). The success in the epitaxial growth of indium on titanium is achieved by lowering the substrate temperature to -150℃ during indium evaporation. We measure the critical temperature under a bias current of 10 μA, and obtain different superconducting transition temperatures ranging from 645 mK to 2.7 K by adjusting the thickness ratio of Ti/In. Our results demonstrate that the transition temperature decreases as the thickness ratio of Ti/In increases.
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Received: 07 February 2017
Revised: 20 March 2018
Accepted manuscript online:
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PACS:
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74.78.-w
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(Superconducting films and low-dimensional structures)
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Corresponding Authors:
Xie-Gang Zhu, Xin-Chun Lai
E-mail: zhuxg02@gmail.com;laixinchun@caep.cn
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Cite this article:
Zhao-Hong Mo(莫钊洪), Chao Lu(路超), Yi Liu(刘毅), Wei Feng(冯卫), Yun Zhang(张云), Wen Zhang(张文), Shi-Yong Tan(谭世勇), Hong-Jun Zhang(张宏俊), Chun-Yu Guo(郭春煜), Xiao-Dong Wang(汪小冬), Liang Wang(王亮), Rui-Zhu Yang(杨蕊竹), Zhong-Guo Ren(任忠国), Xie-Gang Zhu(朱燮刚), Zhong-Hua Xiong(熊忠华), Qi An(安琪), Xin-Chun Lai(赖新春) Superconductivity of bilayer titanium/indium thin film grown on SiO2/Si (001) 2018 Chin. Phys. B 27 067403
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