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Chin. Phys. B, 2015, Vol. 24(1): 018501    DOI: 10.1088/1674-1056/24/1/018501
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Prev   Next  

GaSb p-channel metal-oxide-semiconductor field-effect transistor and its temperature dependent characteristics

Zhao Lian-Feng (赵连锋), Tan Zhen (谭桢), Wang Jing (王敬), Xu Jun (许军)
Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China
Abstract  

GaSb p-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) with an atomic layer deposited Al2O3 gate dielectric and a self-aligned Si-implanted source/drain are experimentally demonstrated. Temperature dependent electrical characteristics are investigated. Different electrical behaviors are observed in two temperature regions, and the underlying mechanisms are discussed. It is found that the reverse-bias pn junction leakage of the drain/substrate is the main component of the off-state drain leakage current, which is generation-current dominated in the low temperature regions and is diffusion-current dominated in the high temperature regions. Methods to further reduce the off-state drain leakage current are given.

Keywords:  GaSb      metal-oxide-semiconductor field-effect transistor      temperature dependent characteristics      drain leakage current  
Received:  20 May 2014      Revised:  08 July 2014      Accepted manuscript online: 
PACS:  85.30.Tv (Field effect devices)  
  81.05.Ea (III-V semiconductors)  
  77.55.dj (For nonsilicon electronics (Ge, III-V, II-VI, organic electronics))  
Fund: 

Project supported by the National Basic Research Program of China (Grant No. 2011CBA00602) and the National Science and Technology Major Project of the Ministry of Science and Technology of China (Grant No. 2011ZX02708-002).

Corresponding Authors:  Xu Jun     E-mail:  junxu@tsinghua.edu.cn

Cite this article: 

Zhao Lian-Feng (赵连锋), Tan Zhen (谭桢), Wang Jing (王敬), Xu Jun (许军) GaSb p-channel metal-oxide-semiconductor field-effect transistor and its temperature dependent characteristics 2015 Chin. Phys. B 24 018501

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