CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Prev
Next
|
|
|
Detecting magnetic field direction by a micro beam operating in different vibration modes |
Chen Jie(陈洁), Qin Ming(秦明), and Huang Qing-An(黄庆安)† |
Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, China |
|
|
Abstract A new method to detect the magnetic field direction by using a silicon structure is presented in this paper. The structure includes a micro beam and an in-plane coil electrode. When the electrode under a magnetic field is applied with an alternating current, the micro beam is actuated under the effect of the Lorentz forces. Magnetic fields of different directions cause different vibration profiles. The direction of the magnetic field is obtained by measuring the vibration amplitudes of the micro beam, which is driven to work at first- and second-order resonant modes. A micro structure has been fabricated using the bulk micromachined silicon process. A laser Doppler vibrometer system is implemented to measure the vibration amplitudes. The experimental results show that the amplitude of the structure, which depends on the different modes, is a sine or cosine function of the angle of the magnetic field. It agrees well with the simulation result. Currently a resolution of 10° for the magnetic field direction measurement can be obtained using the detecting principle.
|
Received: 11 April 2011
Revised: 11 May 2011
Accepted manuscript online:
|
PACS:
|
71.10.-w
|
(Theories and models of many-electron systems)
|
|
71.45.-d
|
(Collective effects)
|
|
Cite this article:
Chen Jie(陈洁), Qin Ming(秦明), and Huang Qing-An(黄庆安) Detecting magnetic field direction by a micro beam operating in different vibration modes 2011 Chin. Phys. B 20 097101
|
[1] |
Lenz J E 1990 Proc. IEEE 78 973
|
[2] |
Yang G, Tu B H, Li G H, Zhao H W and Zhou S P 2008 Chin. Phys. B 17 1674
|
[3] |
Fang Y M, Huang Q A and Li W H 2008 Chin. Phys. B 17 1715
|
[4] |
Baglio S, Latorre L and Nouet P 1999 Proceedings of the 16th IEEE of Instrumentation and Measurement Technology Conference, May 24—26, 1999 Venice, Italy, p. 452
|
[5] |
Beroulle V, Bertrand Y, Latorre L and Noue P 2003 Sens. Actuators A 103 23
|
[6] |
Dumas N, Azais F, Latorre L and Nouet P 2005 Proceedings of the 23rd IEEE VLSI Test Symposium, May 1—5, 2005 Palm Springs, USA, p. 213
|
[7] |
Sunier R, Vancura T, Li Y, Kirstein K and Baltes H 2006 J. Microelectromech. Syst. 15 1098
|
[8] |
Eyre B, Pister K S J and Kaiser W 1998 IEEE Electron Device Lett. 19 496
|
[9] |
Brugger S, Simon P and Paul O 2006 Proceedings of the 5th IEEE Conference on Sensors, October 22—25, 2006 Daegu, Korea, p. 1016
|
[10] |
Brugger S and Paul O 2008 Proceedings of the IEEE 21st Annual International Conference on Micro Electro Mechanical Systems, January 13—17, 2008 Tucson, USA, p. 944
|
[11] |
Brugger S and Paul O 2009 J. Microelectromech. Syst. 18 1432
|
[12] |
Leichle T C ,Ye W and Allen M G 2003 Proceedings of the IEEE 16th Annual International Conference on Micro Electro Mechanical Systems, January 19—23 , 2003 Kyoto, Japan, p. 514
|
[13] |
Leichle T C, Arx M V, Reiman S, Zana I, Ye W and Allen M G 2004 J. Micromech. Microeng. 14 462
|
[14] |
Choi S, Kim S H, Yoon Y K and Allen M G 2006 IEEE Trans. Mag. Conf. 42 3506
|
[15] |
Chen J, Huang Q A and Qin M 2009 Proceedings of the 8th IEEE Conference on Sensors, October 25—28, 2009 Christchurch, New Zealand, p. 1246
|
[16] |
Chen J, Qin M and Huang Q A 2011 Proceedings of the 16th International Conference on Solid-State Sensors, Actuators and Microsystems, June 5—9, 2011 Beijing, China, p. 1108
|
[17] |
Zhao J P, Chen H L, Huang J M and Liu A Q 2005 Sens. Actuators A 120 199
|
[18] |
Kadar Z, Kindt W, Bossche A and Mollinger J 1996 Sens. Actuators A 53 299
|
[19] |
Bao M H and Yang H 2007 Sens. Actuators A 136 3
|
[20] |
Ozdoganlar O B, Hansche B D and Carne T G 2005 Exp. Mech. 45 498
|
[21] |
Song J, Huang Q A, Li M and Tang J Y 2009 J. Microelectromech. Syst. 18 274
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|