CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Prev
Next
|
|
|
Al/Ti/4H–SiC Schottky barrier diodes with inhomogeneous barrier heights |
Wang Yue-Hu(王悦湖)†,Zhang Yi-Men(张义门),Zhang Yu-Ming(张玉明), Song Qing-Wen(宋庆文),and Jia Ren-Xu(贾仁需) |
School of Microelectronics and Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, Xidian University, Xi'an 710071, China |
|
|
Abstract This paper investigates the current--voltage ($I$--$V$) characteristics of Al/Ti/4H--SiC Schottky barrier diodes (SBDs) in the temperature range of 77 K--500 K, which shows that Al/Ti/4H--SiC SBDs have good rectifying behaviour. An abnormal behaviour, in which the zero bias barrier height decreases while the ideality factor increases with decreasing temperature ($T$), has been successfully interpreted by using thermionic emission theory with Gaussian distribution of the barrier heights due to the inhomogeneous barrier height at the Al/Ti/4H--SiC interface. The effective Richardson constant $A^*=154$ A/cm$^{2}$ $\cdot$ K$^{2}$ is determined by means of a modified Richardson plot $\ln(I_{0}/T^{2})-(q\sigma )^{2}/2(kT)^{2}$ versus $q/kT$, which is very close to the theoretical value 146~A/cm$^{2}$ $\cdot$ K$^{2}$.
|
Received: 06 December 2010
Revised: 01 March 2011
Accepted manuscript online:
|
PACS:
|
73.30.+y
|
(Surface double layers, Schottky barriers, and work functions)
|
|
73.40.Sx
|
(Metal-semiconductor-metal structures)
|
|
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 60876061) and the Key Laboratory Science Foundation (Grant No. 20090C1403). |
Cite this article:
Wang Yue-Hu(王悦湖), Zhang Yi-Men(张义门), Zhang Yu-Ming(张玉明), Song Qing-Wen(宋庆文), and Jia Ren-Xu(贾仁需) Al/Ti/4H–SiC Schottky barrier diodes with inhomogeneous barrier heights 2011 Chin. Phys. B 20 087305
|
[1] |
Zhao J H, Alexandorov P and Li X 2003 IEEE Electron Device Lett. 24 402
|
[2] |
Song Q W, Zhang Y M, Zhang Y M, Lü H L, Chen F P and Zheng Q L 2009 Chin. Phys. B 18 5474
|
[3] |
Saxena V, Jian N S and Steckl A J 1999 IEEE Trans. Electron Devices 46 456
|
[4] |
Song Q W, Zhang Y M, Zhang Y M, Zheng Q and Lü H L 2010 it Chin. Phys. B 19 087202
|
[5] |
Via F L, Galvagno G, Roccaforte F, Ruggiero A and Calcagno L 2005 Appl. Phys. Lett. bf87 142105
|
[6] |
Pakma O, Serin N, Serin T and Altindal X 2008 it J. Appl. Phys. 104 014501
|
[7] |
Defives D, Noblanc O, Dua C, Brylinski C, Barthula M, Fortuna V A and Meyer F 1999 IEEE Trans. Electron Devices 46 449
|
[8] |
Yidiz D E, Altindal S and Kanbur H 2008 J. Appl. Phys. bf 103 124502
|
[9] |
Ewing D J and Porter L M 2007 J. Appl. Phys. 101 114514
|
[10] |
Biber M, Gullu O, Duman S and Turut A 2007 Appl. Surf. Sci. 253 7246
|
[11] |
Tacscchioglu .I, Aydemir U and Althindal cS2010 J. Appl. Phys. 108 064506
|
[12] |
Tung R T 1992 Phys. Rev. B bf45 13509
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|