Shock wave velocity measurement in the Al2O3 under ultrahigh pressure

doi:10.1088/1674-1056/20/6/065202

Abstract In indirect-drive experiment, the blank effect caused by X-rays from Hohlraum will show the dark area in time scale of optical streak camera (OSC). This blank effect, which was a serious problem in indirect-drive shock wave experiments, has been explained by the semiconductor model. The X-rays cause the band to band transition and the probe laser is absorbed by the intraband transition, which leads to a dark region in time scale of the OSC image. In the experiment, the reflectivity of shock wave front was measured to be about 50% at shock wave velocity 32 km/s and was compared to the theoretical calculations with the Drude free electron model. From the experimental data, it is found that the blank effect can be avoided at radiation temperature of 170 eV if the Al layer is thicker than 60 μm.

Keywords: shock wave optical diagnosis interfere meter semiconductor model

Received: 10 September 2010
Revised: 24 February 2011
Accepted manuscript online:

PACS:	52.35.Tc	(Shock waves and discontinuities)
	52.50.Lp	(Plasma production and heating by shock waves and compression)
	62.50.+p

Fund: Project supported by the National Natural Science Foundation of China (Grant No. 10805041) and the Science and Technology Foundation on Plasma Physics Laboratory (Grant No. 9140C6801021001).

Cite this article:

Wang Feng (王峰), Peng Xiao-Shi (彭晓世), Liu Shen-Ye (刘慎业), Li Yong-Sheng (李永升), Jiang Xiao-Hua (蒋小华), Ding Yong-Kun (丁永坤) Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure 2011 Chin. Phys. B 20 065202

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Shock wave velocity measurement in the Al2O3 under ultrahigh pressure

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Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure