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Acta Physica Sinica (Overseas Edition), 1996, Vol. 5(7): 530-537    DOI: 10.1088/1004-423X/5/7/007
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED Ge-Au FILM AND Ge-Au/Au BILAYER FILMS

BA LONG (巴龙)a, ZENG JIAN-LIN (曾建林)a, ZHANG SHU-YUAN (张庶元)b, WU ZI-QIN (吴自勤)ab
a Fundamental Physics Center, University of Science and Technology of China, Hefei 230026, China; b Microstructure Research Laboratory, University of Science and Technology of China, Hefei 230026, China
Abstract  The as-deposited and annealed Ge-Au film and Ge-Au/Au bilayer films have been observed by transmission electron microscopy. The bilayer with a composition of Ge-5at%Au film is amorphous, while the Ge-22at%Au film is polycrystalline. Higher concentration of Au raises the structural heterogeneity and instability. Fractals can be observed in the Ge-5at%Au/Au bilayer samples annealed at 60-100℃. The difference of the fractal patterns generated from Ge-Au/An and a-Ge/Au films call be attributed to the higher heterogeneity and instability in Ge-Au/An bilayers.
Received:  09 May 1995      Accepted manuscript online: 
PACS:  68.37.Lp (Transmission electron microscopy (TEM))  
  61.43.Hv (Fractals; macroscopic aggregates (including diffusion-limited Aggregates))  
  81.40.Ef (Cold working, work hardening; annealing, post-deformation annealing, quenching, tempering recovery, and crystallization)  
  68.55.-a (Thin film structure and morphology)  
  61.05.jm (Convergent-beam electron diffraction, selected-area electron diffraction, nanodiffraction)  
Fund: Project supported by the National Natural Science Foundation of China, and the Foundation for Ph. D.Education of National Education Commission of China.

Cite this article: 

BA LONG (巴龙), ZENG JIAN-LIN (曾建林), ZHANG SHU-YUAN (张庶元), WU ZI-QIN (吴自勤) MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED Ge-Au FILM AND Ge-Au/Au BILAYER FILMS 1996 Acta Physica Sinica (Overseas Edition) 5 530

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