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Chin. Phys. B, 2014, Vol. 23(6): 066804    DOI: 10.1088/1674-1056/23/6/066804
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

Sputtering pressure influence on growth morphology, surface roughness, and electrical resistivity for strong anisotropy beryllium film

Luo Bing-Chia b, Li Kaia b, Kang Xiao-Lia, Zhang Ji-Qianga, He Yu-Dana, Luo Jiang-Shana, Wu Wei-Donga b, Tang Yong-Jiana
a Research Center of Laser Fusion, ChinaAcademy of Engineering Physics, Mianyang 621900, China;
b Science and Technology on Plasma Physics Laboratory, Mianyang 621900, China
Abstract  The strong anisotropy beryllium (Be) films are fabricated at different sputtering pressures by direct current magnetron sputtering. With the increase of pressure, the deposition rate of Be film first increases, and when the pressure exceeds 0.8 Pa, it gradually descends. The X-ray diffraction analysis indicates that Be film is of α-Be phase, its surface always reveals the (101) crystal plane possessing the low surface energy. As for the growth morphology of Be film, the surface is mainly characterized by the fibrous grains, while the cross section shows a transition from a columnar grain to a mixed grain consisting of a cone-shaped grain and a columnar grain as the sputtering pressure increases. The large grain fraction decays exponentially from 75.0% to 59.3% with the increase of sputtering pressure p, which can improve the grain size uniformity. The surface roughness increases due to the insufficient atom diffusion, which is comparable to its decrease due to the etching effect at p < 0.8 Pa, while it increases drastically at p > 0.8 Pa, and this increase is dominated by the atom diffusion. The electrical resistivity values of Be films range from 1.7 uΩ·m to 2.7 uΩ·m in the range 0.4 Pa-1.2 Pa, which is 50 times larger than the bulk resistivity.
Keywords:  magnetron sputtering      growth morphology      Be films      electrical resistivity  
Received:  27 September 2013      Revised:  12 December 2013      Published:  15 June 2014
PACS:  68.55.-a (Thin film structure and morphology)  
  68.55.J- (Morphology of films)  
  68.55.Nq (Composition and phase identification)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 11204280).
Corresponding Authors:  Luo Jiang-Shan     E-mail:  jiangshanluo@caep.ac.cn

Cite this article: 

Luo Bing-Chi, Li Kai, Kang Xiao-Li, Zhang Ji-Qiang, He Yu-Dan, Luo Jiang-Shan, Wu Wei-Dong, Tang Yong-Jian Sputtering pressure influence on growth morphology, surface roughness, and electrical resistivity for strong anisotropy beryllium film 2014 Chin. Phys. B 23 066804

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