Structural and optical properties of tungsten-doped vanadium dioxide films

doi:10.1088/1674-1056/22/6/066803

Abstract Thin films of tungsten (W)-doped thermochromic vanadium dioxide (VO₂) were deposited onto the soda-lime glass and fused silica by radio frequency magnetron sputtering. The doped VO₂ films were characterized by X-ray diffraction, optical transmittance measurement, and near field optical microscopy with Raman. X-ray diffraction patterns show that the (011) peak of W-doped thermochromic VO₂ film shifts to a lower diffraction angle with the increase of W concentration. The optical measurements indicated that the transmittance change (ΔT) at wavelength of 2500 nm drops from 65% (ΔT at 35 ℃ and 80 ℃ for undoped VO₂ film) to 38% (ΔT at 30 ℃ and 42 ℃ for the doped VO₂ film). At the same time, phase transition temperature drops from 65 ℃ to room temperature or lower with the increase of W concentration. Near field optical microscopy image shows that the surface of W-doped VO₂ film is smooth. Raman results show that the main Raman modes of W-doped VO₂ are centered at 614 cm^-1, the same as that of undoped VO₂, suggesting no Raman mode changes for lightly W-doped VO₂ at room temperature, due to no phase transition appearing under this condition.

Keywords: tungsten-doped vanadium dioxide thermochromic magnetron sputtering

Received: 03 May 2012
Revised: 26 October 2012
Accepted manuscript online:

PACS:	68.55.-a	(Thin film structure and morphology)
	81.15.Cd	(Deposition by sputtering)
	87.64.km	(Infrared)
	87.64.kp	(Raman)

Fund: Project supported by the Chinese Universities Scientific Fund (Grant No. 2013QJ007), the Science Fund of China Agricultural University (Grant No. 2007037), the Major Project Foundation of Science and Technology Innovation in Advanced Education (Grant No. 21010112).

Corresponding Authors: Wang Xue-Jin
E-mail: xjwang@cau.edu.cn

Cite this article:

Wang Xue-Jin (王学进), Liu Yu-Ying (刘玉颖), Li De-Hua (李德华), Feng Bao-Hua (冯宝华), He Zhi-Wei (何志巍), Qi Zheng (祁铮) Structural and optical properties of tungsten-doped vanadium dioxide films 2013 Chin. Phys. B 22 066803

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