Abstract The effect of applied longitudinal magnetic field on the self-pinched critical current in the intense electron beam diode is discussed. The self-pinched critical current is derived and its validity is tested by numerical simulations. The results shows that an applied longitudinal magnetic field tends to increase the self-pinched critical current. Without the effect of anode plasma, the maximal diode current approximately equals the self-pinched critical current with the longitudinal magnetic field applied; when self-pinched occurs, the diode current approaches the self-pinched critical current.
Received: 04 March 2005
Revised: 18 July 2005
Accepted manuscript online:
PACS:
52.75.Fk
(Magnetohydrodynamic generators and thermionic convertors; plasma diodes)
Fund: Project support by National High Technology 863 Program of China (Grant No AA834060).
Cite this article:
Liu Guo-Zhi (刘国治), Huang Wen-Hua (黄文华), Shao Hao (邵浩), Xiao Ren-Zhen (肖仁珍) Effect of longitudinal applied magnetic field on the self-pinched critical current in intense electron beam diode 2006 Chinese Physics 15 600
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