Abstract Shortening the distance between the depletion region and the electrodes to reduce the trapped probability of carriers is a useful approach for improving the performance of heterojunction. The CdS/Si nanofilm heterojunctions are fabricated by using the radio frequency magnetron sputtering method to deposit the amorphous silicon nanofilms and CdS nanofilms on the ITO glass in turn. The relation of current density to applied voltage (I-V) shows the obvious rectification effect. From the analysis of the double logarithm I-V curve it follows that below ∼ 2.73 V the electron behaviors obey the Ohmic mechanism and above ∼ 2.73 V the electron behaviors conform to the space charge limited current (SCLC) mechanism. In the SCLC region part of the traps between the Fermi level and conduction band are occupied, and with the increase of voltage most of the traps are occupied. It is believed that CdS/Si nanofilm heterojunction is a potential candidate in the field of nano electronic and optoelectronic devices by optimizing its fabricating procedure.
(Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)
Fund: Project supported by the Natural Science Foundation of Henan Province,China (Grant No. 202300410304) and the Key Research Project for Science and Technology of the Education Department of Henan Province, China (Grant No. 21A140021).
Effects of preparation parameters on growth and properties of β-Ga2O3 film Zi-Hao Chen(陈子豪), Yong-Sheng Wang(王永胜), Ning Zhang(张宁), Bin Zhou(周兵), Jie Gao(高洁), Yan-Xia Wu(吴艳霞), Yong Ma(马永), Hong-Jun Hei(黑鸿君), Yan-Yan Shen(申艳艳), Zhi-Yong He(贺志勇), and Sheng-Wang Yu(于盛旺). Chin. Phys. B, 2023, 32(1): 017301.
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