TOTAL REFLECTION CHARACTERISTICS OF PLANE WAVES AT THE INTERFACE INCLUDING A CHIRAL MEDIUM
LI ZHAN-JIE (李占杰)a, XIONG YUAN-SHENG (熊元生)a, LIU ZU-LI (刘祖黎)a, YAO KAI-LUN (姚凯伦)b
a Department of Physics, Huazhong University of Science and Technology, Wuhan 430074, China; b International Center of Materials Physics, Academia Sinica, Shenyang 110015, China
Abstract The total reflection characteristics of plane waves from the interfac e including a chiral medium have been studied with complex chiral material param eters. The possible values of chirality admittance $\zeta$c are determined for left-circularly polarized (LCP) and right-circularly polarized (RCP) total reflections at fixed incident angles from an interface between free space and a chiral medium. It is found that there exists a region of parameter $\zeta$c , in which neither LCP nor RCP modes can be totally reflected for any incident angle $\theta$. It is demonstrated that for $\zeta$1 = Re ($\zeta$c)>0, total reflection is preferred for LCP mode whereas RCP total reflection is favored for $\zeta$1<0.
Received: 04 August 1997
Accepted manuscript online:
(Optical properties of bulk materials and thin films)
Fund: Project supported by the National Natural Science Foundation of China and the Li fe Science Foundation of Huazhong University of Science and Technology, China.
Cite this article:
LI ZHAN-JIE (李占杰), XIONG YUAN-SHENG (熊元生), LIU ZU-LI (刘祖黎), YAO KAI-LUN (姚凯伦) TOTAL REFLECTION CHARACTERISTICS OF PLANE WAVES AT THE INTERFACE INCLUDING A CHIRAL MEDIUM 1998 Acta Physica Sinica (Overseas Edition) 7 432
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