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Measurement of the equivalent complex permittivity of electromagnetic structural materials without prior thickness |
| Xiang-Bao Zhu(朱香宝)1, Yun-Peng Zhang(张云鹏)1,†, Pin-Hong Xie(谢品鸿)1, Yi-Hang Tu(涂一航)2, Jia-Wei Long(龙嘉威)1, Xue Niu(牛雪)1, Chong Gao(高冲)1, Cheng-Yong Yu(余承勇)1, Yong Gao(高勇)3, and En Li(李恩)1 |
1 School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China;
2 School of Electronic Information and Electrical Engineering, Chengdu University, Chengdu 610106, China;
3 School of Computer Science and Information Engineering, Hefei University of Technology, Hefei 230601, China |
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Abstract Electromagnetic structural materials exhibit significant sensitivity to the polarization state and incidence angle of electromagnetic waves. The equivalent complex permittivity is the core parameter that describes the dielectric properties of electromagnetic structural materials. Therefore, accurate characterization of their equivalent complex permittivity is essential for establishing electromagnetic models and guiding the design of functional devices. This paper proposes a broadband inversion method based solely on reflection measurements at different incident polarizations and incident angles. By establishing a set of adaptive equations for multi-reflection measurement states under oblique incidence, the proposed method directly resolves the equivalent complex permittivity without requiring prior knowledge of the sample thickness and iterative phase unwrapping, and obtains broadband measurement results in a single measurement. The simulation and experimental results show that this method has good testing consistency and accuracy. This study provides a high-precision, low-cost and efficient testing solution for dielectric property evaluation of electromagnetic structural materials. It can simplify the complex modeling design of electromagnetic structural materials into an equivalent single-layer material design, providing a reference value for rapid analysis of the scattering characteristics of complex structures.
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Received: 07 July 2025
Revised: 13 August 2025
Accepted manuscript online: 08 September 2025
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PACS:
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01.40.gf
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(Theory of testing and techniques)
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52.25.Mq
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(Dielectric properties)
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52.70.Gw
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(Radio-frequency and microwave measurements)
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| Fund: This project is supported by the National Natural Science Foundation of China (Grant Nos. 62201130 and 62301134) and the Fundamental Research Funds for the Central Universities (Grant No. JZ2025HGTB0222). |
Corresponding Authors:
Yun-Peng Zhang
E-mail: zyp_ee@163.com
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Cite this article:
Xiang-Bao Zhu(朱香宝), Yun-Peng Zhang(张云鹏), Pin-Hong Xie(谢品鸿), Yi-Hang Tu(涂一航), Jia-Wei Long(龙嘉威), Xue Niu(牛雪), Chong Gao(高冲), Cheng-Yong Yu(余承勇), Yong Gao(高勇), and En Li(李恩) Measurement of the equivalent complex permittivity of electromagnetic structural materials without prior thickness 2026 Chin. Phys. B 35 040101
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