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Erratum to “Accurate determination of film thickness by low-angle x-ray reflection” |
| Ming Xu(徐明)1,†, Tao Yang(杨涛)1, Wenxue Yu(于文学)2, Ning Yang(杨宁)3, Cuixiu Liu(刘翠秀)1, Zhenhong Mai(麦振洪)1, Wuyan Lai(赖武彦)1, and Kun Tao(陶琨)3 |
1 Institute of Physics&Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080, China;
2 Department of Materials Science, Jilin University, Changchun 130023, China;
3 Department of Materials Science, Tsinghua University, Beijing 100083, China |
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Abstract Equation (6) in Chin. Phys. 09 0833 (2000) is corrected. All subsequent derivations were given based on the correct Eq. (6), so the conclusions in the paper are not affected by the errata.
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Received: 02 August 2022
Accepted manuscript online: 16 August 2022
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Corresponding Authors:
Ming Xu
E-mail: hsuming_2001@aliyun.com
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Cite this article:
Ming Xu(徐明), Tao Yang(杨涛), Wenxue Yu(于文学), Ning Yang(杨宁), Cuixiu Liu(刘翠秀), Zhenhong Mai(麦振洪), Wuyan Lai(赖武彦), and Kun Tao(陶琨) Erratum to “Accurate determination of film thickness by low-angle x-ray reflection” 2022 Chin. Phys. B 31 099901
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| [1] Xu M, Yang T, Yu W X, Yang N, Liu C X, Mai Z H, Lai W Y and Tao K 2000 Chin. Phys. 9 0833 |
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