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Chin. Phys. B, 2021, Vol. 30(10): 107802    DOI: 10.1088/1674-1056/ac04a7
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Optically tuned dielectric characteristics of SrTiO3/Si thin film in the terahertz range

Bin Zou(邹斌)1,3, Qing-Qing Li(李晴晴)1,2, Yu-Ping Yang(杨玉平)1,3,†, and Hai-Zhong Guo(郭海中)2,4,‡
1 School of Science, Minzu University of China, Beijing 100081, China;
2 School of Physics and Microelectronics, Zhengzhou University, Zhengzhou 450052, China;
3 Optoelectronics Research Center, Minzu University of China, Beijing 100081, China;
4 Collaborative Innovation Center of Light Manipulations and Applications, Shandong Normal University, Jinan 250358, China
Abstract  Active control of the optical parameters in strontium titanate (SrTiO3, STO) thin films is highly desirable for tunable terahertz (THz) integrated devices such as filters, phase modulators, and electro-optical devices. In this work, optically tuned dielectric parameters of a STO thin film epitaxially grown on a silicon wafer were characterized in the THz region with an 800 nm laser pump-THz detection system. The refractive index, extinction coefficient, and complex dielectric constant of the STO thin film were calculated using thin-film parameter extraction. Owing to carrier transportation and soft-mode oscillation, the above optical parameters changed notably with the pump power of the external laser. This study is of great significance for rapid and non-contact THz phase-modulation technology and may serve as a powerful tool to tune the dielectric properties of the STO thin films.
Keywords:  terahertz spectroscopy      optical constants      STO/Si film  
Received:  19 March 2021      Revised:  04 May 2021      Accepted manuscript online:  25 May 2021
PACS:  78.47.jh (Coherent nonlinear optical spectroscopy)  
  78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))  
  78.66.-w (Optical properties of specific thin films)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 62075248), the National Key R&D Program of China (Grant Nos. 2017YFB0405400 and 2020YFB2009300), and the Program for the Innovation Team of Science and Technology in University of Henan, China (Grant No. 20IRTSTHN014).
Corresponding Authors:  Yu-Ping Yang, Hai-Zhong Guo     E-mail:  ypyang@muc.edu.cn;hguo@zzu.edu.cn

Cite this article: 

Bin Zou(邹斌), Qing-Qing Li(李晴晴), Yu-Ping Yang(杨玉平), and Hai-Zhong Guo(郭海中) Optically tuned dielectric characteristics of SrTiO3/Si thin film in the terahertz range 2021 Chin. Phys. B 30 107802

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