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Chin. Phys. B, 2021, Vol. 30(9): 094202    DOI: 10.1088/1674-1056/abf0fd

High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

Abdul Wahab1,2,†
1 National Laboratory for Physical Sciences at Microscale, Shanghai Branch, University of Science and Technology of China, Shanghai 201315, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China
Abstract  We aim to present a new scheme for high-dimensional atomic microscopy via double electromagnetically induced transparency in a four-level tripod system. For atom-field interaction, we construct a spatially dependent field by superimposing three standing-wave fields (SWFs) in 3D-atom localization. We achieve a high precision and high spatial resolution of an atom localization by appropriately adjusting the system variables such as field intensities and phase shifts. We also see the impact of Doppler shift and show that it dramatically deteriorates the precision of spatial information on 3D-atom localization. We believe that our suggested scheme opens up a fascinating way to improve the atom localization that supplies some practical applications in atom nanolithography, and Bose-Einstein condensation.
Keywords:  electromagnetically induced transparency      transparency windows  
Received:  15 November 2020      Revised:  28 February 2021      Accepted manuscript online:  23 March 2021
PACS:  42.50.Gy (Effects of atomic coherence on propagation, absorption, and Amplification of light; electromagnetically induced transparency and Absorption)  
Corresponding Authors:  Abdul Wahab     E-mail:,

Cite this article: 

Abdul Wahab High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency 2021 Chin. Phys. B 30 094202

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