|
|
Electronic structures of impurities and point defects in semiconductors |
Yong Zhang(张勇) |
Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC 28223, USA |
|
|
Abstract A brief history of the impurity theories in semiconductors is provided. A bound exciton model is proposed for both donor-and acceptor-like impurities and point defects, which offers a unified understanding for “shallow” and “deep” impurities and point defects. The underlying physics of computational results using different density-functional theory-based approaches are discussed and interpreted in the framework of the bound exciton model.
|
Received: 12 July 2018
Revised: 04 September 2018
Accepted manuscript online:
|
PACS:
|
71.55.-i
|
(Impurity and defect levels)
|
|
72.20.-i
|
(Conductivity phenomena in semiconductors and insulators)
|
|
78.20.-e
|
(Optical properties of bulk materials and thin films)
|
|
Corresponding Authors:
Yong Zhang
E-mail: yong.zhang@uncc.edu
|
Cite this article:
Yong Zhang(张勇) Electronic structures of impurities and point defects in semiconductors 2018 Chin. Phys. B 27 117103
|
[1] |
Gurney R W and Mott N F 1938 Trans. Faraday Soc. 34 506
|
[2] |
Tibbs S R 1939 Trans. Faraday Soc. 35 1471
|
[3] |
Karazhanov S Z, Zhang Y, Wang L W, Mascarenhas A and Deb S 2003 Phys. Rev. B 68 233204
|
[4] |
Zhang Y and Wang J 2014 Phys. Rev. B 90 155201
|
[5] |
Grimmeiss H G 1977 Annu. Rev. Mater. Sci. 7 341
|
[6] |
Hjalmarson H P, Vogl P, Wolford D J and Dow J D 1980 Phys. Rev. Lett. 44 810
|
[7] |
Yu P Y and Cardona M 1995 Fundamentals of semiconductors (Berlin:Springer)
|
[8] |
Mott N F and Gurney R W 1940 Electronic Processes in Ionic Crystals (London:Oxford University Press)
|
[9] |
Bethe H A 1942 Theory of the Boundary Layer of Crystal Rectifiers (Radiation Laboratory, Massachusetts Institute of Technology)
|
[10] |
Kittel C and Mitchell A H 1954 Phys. Rev. 96 1488
|
[11] |
Luttinger J M and Kohn W 1955 Phys. Rev. 97 869
|
[12] |
Baldereschi A and Lipari N O 1974 Phys. Rev. B 9 1525
|
[13] |
Madelung O 1996 Semiconductors-Basic Data (Berlin:Springer)
|
[14] |
Pantelides S T 1978 Rev. Mod. Phys. 50 797
|
[15] |
Van de Walle C G and Neugebauer J 2004 J. Appl. Phys. 95 3851
|
[16] |
Wei S H and Yan Y F 2011 in Advanced Calculations for Defects in Materials edited by A. Alkauskas et al. (New York:WileyVCH)
|
[17] |
Chen W, Tegenkamp C, Pfnür H and Bredow T 2010 Phys. Rev. B 82 104106
|
[18] |
Onton A, Fisher P and Ramdas A K 1967 Phys. Rev. 163 686
|
[19] |
Wei S H and Zunger A 1999 Phys. Rev. B 60 5404
|
[20] |
Baldereschi A and Lipari N O 1973 Phys. Rev. B 8 2697
|
[21] |
Shockley W 1950 Electrons and Holes in Semiconductors with Applications to Transistor Electronics (Princeton:D. VAN NOSTRAND COMPANY, INC,)
|
[22] |
Hopfield J J, Thomas D G and Lynch R T 1966 Phys. Rev. Lett. 17 312
|
[23] |
Sturge M D, Cohen E and Rodgers K F 1977 Phys. Rev. B 15 3169
|
[24] |
Zhang Y, Mascarenhas A and Wang L W 2005 Phys. Rev. B 71 155201
|
[25] |
Trumbore F A, Gershenzon M and Thomas D G 1966 Appl. Phys. Lett. 9 4
|
[26] |
Cohen E and Sturge M D 1977 Phys. Rev. B 15 1039
|
[27] |
Cohen E, Kardontchik J E, Sterenheim M and Sturge M D 1979 Bull. Am. Phys. Soc. 24 900
|
[28] |
Zhang Y 1992 Phys. Rev. B 45 9025
|
[29] |
Fischer D W and Rome J J 1983 Phys. Rev. B 27 4826
|
[30] |
Sturge M D, Vink A T and Kuijpers F P J 1978 Appl. Phys. Lett. 32 49
|
[31] |
Liu Z, Yi X, Wang L, Wei T, Yuan G, Yan J, Wang J, Li J, Shi Y and Zhang Y 2018 Semiconductor Science and Technology 33 114004
|
[32] |
Zhang Z Z, Partoens B, Chang K and Peeters F M 2008 Phys. Rev. B 77 155201
|
[33] |
Lambrecht W R L 2016 Rare Earth Transit. Met. Doping Semiconductor Mater. Edited By V. Dierolf I. T. Ferguson J. M. Zavada (Woodhead Publishing) p. 43
|
[34] |
Bassani F and Parravicini G P 1975 Electron. States Opt. Transit. Solids (Oxford:Pergamon) p. 190
|
[35] |
Wang L W 2009 J. Appl. Phys. 105 123712
|
[36] |
Rohlfing M and Louie S G 1998 Phys. Rev. Lett. 80 3320
|
[37] |
Zhang G, Canning A, GronbechJensen N, Derenzo S and Wang L W 2013 Phys. Rev. Lett. 110 166404
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|