A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index

doi:10.1088/1674-1056/25/3/037303

Abstract In this paper, a subwavelength metal-grating assisted sensor of Kretschmann style that is capable of detecting the sample with a refractive index higher than that of the substrate is proposed. The sensor configuration is similar to the traditional Kretschmann structure, but the metal film is pattered into a grating. As a TM-polarized laser beam impinges from the substrate, a resonant dip point in reflectance curve is produced at a certain incident angle. Our studies indicate that the sensing sensitivity and resolution are affected by the grating's gap and period, and after these parameters have been optimized, a sensing sensitivity of 51.484°/RIU is obtained with a slightly changing resolution.

Keywords: surface plasmons sensing finite-difference time-domain method

Received: 30 September 2015
Revised: 24 November 2015
Accepted manuscript online:

PACS:	73.20.Mf	(Collective excitations (including excitons, polarons, plasmons and other charge-density excitations))
	07.07.Df	(Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing)
	02.60.Cb	(Numerical simulation; solution of equations)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61137005 and 61178067), the Science Foundation of Shanxi Province, China (Grant No. 2013021004-3/2014021021-1), the Pre-studied Project on Weapon Equipment, China (Grant No. 201262401090404), and the Specialized Research Foundation for Doctor of School, China (Grant No. 20122027).

Corresponding Authors: Xu-Feng Li
E-mail: xfli@mail.dlut.edu.cn

Cite this article:

Xu-Feng Li(李旭峰), Wei Peng(彭伟), Ya-Li Zhao(赵亚丽), Qiao Wang(王乔), Ji-Lin Wei(魏计林) A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index 2016 Chin. Phys. B 25 037303

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A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index

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