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Chin. Phys. B, 2016, Vol. 25(10): 108702    DOI: 10.1088/1674-1056/25/10/108702

Elemental x-ray imaging using Zernike phase contrast

Qi-Gang Shao(邵其刚)1, Jian Chen(陈健)1, Faiz Wali1, Yuan Bao(鲍园)1, Zhi-Li Wang(王志立)2, Pei-Ping Zhu(朱佩平)3, Yang-Chao Tian(田扬超)1, Kun Gao(高昆)1
1 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China;
2 School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China;
3 Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049, China
Abstract  We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.
Keywords:  x-ray imaging      Zernike phase contrast      elemental imaging  
Received:  13 April 2016      Revised:  17 May 2016      Accepted manuscript online: 
PACS:  87.59.-e (X-ray imaging)  
  68.37.Yz (X-ray microscopy) (Phase contrast and DIC)  
Fund: Project supported by the National Basic Research Program of China (Grant No. 2012CB825801) and the National Natural Science Foundation of China (Grant Nos. 11505188, and 11305173).
Corresponding Authors:  Pei-Ping Zhu, Yang-Chao Tian, Kun Gao     E-mail:;;

Cite this article: 

Qi-Gang Shao(邵其刚), Jian Chen(陈健), Faiz Wali, Yuan Bao(鲍园), Zhi-Li Wang(王志立), Pei-Ping Zhu(朱佩平), Yang-Chao Tian(田扬超), Kun Gao(高昆) Elemental x-ray imaging using Zernike phase contrast 2016 Chin. Phys. B 25 108702

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