High dV/dt immunity MOS controlled thyristor using a double variable lateral doping technique for capacitor discharge applications

doi:10.1088/1674-1056/23/7/077307

Abstract An analysis model of the dV/dt capability for a metal-oxide-semiconductor (MOS) controlled thyristor (MCT) is developed. It is shown that, in addition to the P-well resistance reported previously, the existence of the OFF-FET channel resistance in the MCT may degrade the dV/dt capability. Lower P-well and N-well dosages in the MCT are useful in getting a lower threshold voltage of OFF-FET and then a higher dV/dt immunity. However, both dosages are restricted by the requirements for the blocking property and the forward conduction capability. Thus, a double variable lateral doping (DVLD) technique is proposed to realize a high dV/dt immunity without any sacrifice in other properties. The accuracy of the developed model is verified by comparing the obtained results with those from simulations. In addition, this DVLD MCT features mask-saving compared with the conventional MCT fabrication process. The excellent device performance, coupled with the simple fabrication, makes the proposed DVLP MCT a promising candidate for capacitor discharge applications.

Keywords: MOS controlled thyristor capacitor discharge

Received: 08 February 2014
Revised: 01 April 2014
Accepted manuscript online:

PACS:	73.61.Cw	(Elemental semiconductors)
	73.40.Qv	(Metal-insulator-semiconductor structures (including semiconductor-to-insulator))
	73.90.+f	(Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures)

Fund: Project supported by the National Natural Science Foundation of China (Grant No. U1330114), the Advance Research Program, China (Grant No. 51308030407), and the Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China (Grant No. ZHD201201).

Corresponding Authors: Chen Wan-Jun
E-mail: wjchen@uestc.edu.cn

About author: 73.61.Cw; 73.40.Qv; 73.90.+f

Cite this article:

Chen Wan-Jun (陈万军), Sun Rui-Ze (孙瑞泽), Peng Chao-Fei (彭朝飞), Zhang Bo (张波) High dV/dt immunity MOS controlled thyristor using a double variable lateral doping technique for capacitor discharge applications 2014 Chin. Phys. B 23 077307

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High dV/dt immunity MOS controlled thyristor using a double variable lateral doping technique for capacitor discharge applications

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