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Chin. Phys. B, 2008, Vol. 17(4): 1443-1447    DOI: 10.1088/1674-1056/17/4/049
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

The structure dependence of exchange bias in ferromagnetic/antiferromagnetic bilayers

Xu Xiao-Yong(许小勇), Wang Mao-Hua(王茂华), and Hu Jing-Guo(胡经国)
College of Physics Science and Technology, University of Yangzhou, Yangzhou 225002, China
Abstract  The structure dependence of exchange bias in ferromagnetic/antiferromagnetic (FM/AF) bilayers has been investigated in detail by extending Slonczewski's `proximity magnetism' idea. Here three important parameters are discussed for FM/AF bilayers, i.e. interfacial bilinear exchange coupling $J_{1}$, interfacial biquadratic (spin-flop) exchange coupling $J_{2}$ and antiferromagnetic layer thickness $t_{\rm AF}$. The results show that both the occurrence and the variety of the exchange bias strongly depend on the above parameters. More importantly, the small spin-flop exchange coupling may result in an exchange bias without the interfacial bilinear exchange coupling. However, in general, the spin-flop exchange coupling cannot result in the exchange bias. The corresponding critical parameters in which the exchange bias will occur or approach saturation are also presented.
Keywords:  FM/AF bilayers      exchange coupling      exchange bias  
Received:  23 September 2007      Revised:  19 November 2007      Accepted manuscript online: 
PACS:  75.25.+z  
  75.30.Et (Exchange and superexchange interactions)  
  75.40.Mg (Numerical simulation studies)  
  75.50.Ee (Antiferromagnetics)  
  75.70.Cn (Magnetic properties of interfaces (multilayers, superlattices, heterostructures))  
Fund: Project supported by the National Natural Sciences Foundation of China (Grant No 10347118) and the Natural Science Foundation of Education Commission of Jiangsu Province, China (Grant No 2006KJB140133).

Cite this article: 

Xu Xiao-Yong(许小勇), Wang Mao-Hua(王茂华), and Hu Jing-Guo(胡经国) The structure dependence of exchange bias in ferromagnetic/antiferromagnetic bilayers 2008 Chin. Phys. B 17 1443

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