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Acta Physica Sinica (Overseas Edition), 1997, Vol. 6(10): 746-751    DOI: 10.1088/1004-423X/6/10/005
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

HEAVY ION TRACK DIAMETERS IN MICA STUDIED WITH SCANNING FORCE MICROSCOPE

WANG YU-GANG (王宇钢)a, ZHAO WEI-JIANG (赵渭江)a, J.ACKERMANNb, A.MLLERb, R.NEUMANNb
a Institute of Heavy Ion Physics, Peking University, Beijing 100871, China; b Gesellschaft für Schwerionenforschung, (GSI) Planckstr. 1, D 64291 Darmstadt, Germany
Abstract  In the present study, the scanning force microscope (SFM) was employed to measure the heavy ion track diameters in mica and was operated in the lateral-force mode with different loading forces. The mica samples were irradiated with Se, Au, Pb and Zn ions with a kinetic energy of 11.4 MeV/u at the UNILAC of GSI. The measured average track diameter increased slowly with increasing loading force between the SFM tip and sample. The experimental data pointed out that the track diameter versus loading force could be fitted by a linear function both for Se and Au ion species and the slopes of the fitted lines were nearly the same. By extrapolating to zero loading force, the intrinsic diameters of the ion tracks were obtained. A possible mechanism for the observations was discussed.
Received:  25 February 1997      Accepted manuscript online: 
PACS:  61.80.Jh (Ion radiation effects)  
  68.37.Ps (Atomic force microscopy (AFM))  
  61.82.Ms (Insulators)  

Cite this article: 

WANG YU-GANG (王宇钢), ZHAO WEI-JIANG (赵渭江), J.ACKERMANN, A.MLLER, R.NEUMANN HEAVY ION TRACK DIAMETERS IN MICA STUDIED WITH SCANNING FORCE MICROSCOPE 1997 Acta Physica Sinica (Overseas Edition) 6 746

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