Chin. Phys. B
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Chin. Phys. B  2020, Vol. 29 Issue (4): 046106    DOI: 10.1088/1674-1056/ab7804
SPECIAL TOPIC—Ion beam technology Current Issue| Next Issue| Archive| Adv Search |
In situ luminescence measurement of 6H-SiC at low temperature
Meng-Lin Qiu(仇猛淋)1, Peng Yin(殷鹏)1, Guang-Fu Wang(王广甫)1,2, Ji-Gao Song(宋纪高)1, Chang-Wei Luo(罗长维)1, Ting-Shun Wang(王庭顺)1, Guo-Qiang Zhao(赵国强)1, Sha-Sha Lv(吕沙沙)1, Feng-Shou Zhang(张丰收)1,2, Bin Liao(廖斌)1
1 Key Laboratory of Beam Technology of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China;
2 Beijing Radiation Center, Beijing 100875, China

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