Symmetry quantification and segmentation in STEM imaging through Zernike moments
Jiadong Dan1,2,†, Cheng Zhang3, Xiaoxu Zhao(赵晓续)4, and N. Duane Loh1,2,3,‡
1 Department of Biological Sciences, National University of Singapore, Singapore; 2 Center for Bioimaging Sciences (CBIS), National University of Singapore, Singapore; 3 Department of Physics, National University of Singapore, Singapore; 4 School of Materials Science and Engineering, Peking University, Beijing 100871, China
Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS, enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.
(Nanoscale materials and structures: fabrication and characterization)
Fund: N.D.L. acknowledges funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05) and the National University of Singapore Early Career Research Award.
Corresponding Authors:
Jiadong Dan, N. Duane Loh
E-mail: jiadong.dan@u.nus.edu;duaneloh@nus.edu.sg
Cite this article:
Jiadong Dan, Cheng Zhang, Xiaoxu Zhao(赵晓续), and N. Duane Loh Symmetry quantification and segmentation in STEM imaging through Zernike moments 2024 Chin. Phys. B 33 086803
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