Symmetry quantification and segmentation in STEM imaging through Zernike moments

doi:10.1088/1674-1056/ad51f4

Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS$_2$, enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.

Keywords: scanning transmission electron microscopy (STEM) symmetry segmentation

Received: 30 March 2024
Revised: 24 May 2024
Accepted manuscript online: 30 May 2024

PACS:	68.37.Ma	(Scanning transmission electron microscopy (STEM))
	61.50.Ah	(Theory of crystal structure, crystal symmetry; calculations and modeling)
	07.05.Pj	(Image processing)
	81.07.-b	(Nanoscale materials and structures: fabrication and characterization)

Fund: N.D.L. acknowledges funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05) and the National University of Singapore Early Career Research Award. This project is supported by the Eric and Wendy Schmidt AI in Science Postdoctoral Fellowship, a Schmidt Sciences program.

Corresponding Authors: Jiadong Dan, N. Duane Loh
E-mail: jiadong.dan@u.nus.edu;duaneloh@nus.edu.sg

Cite this article:

Jiadong Dan, Cheng Zhang, Xiaoxu Zhao(赵晓续), and N. Duane Loh Symmetry quantification and segmentation in STEM imaging through Zernike moments 2024 Chin. Phys. B 33 086803

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Symmetry quantification and segmentation in STEM imaging through Zernike moments

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