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Chin. Phys. B, 2013, Vol. 22(11): 116102    DOI: 10.1088/1674-1056/22/11/116102
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

Misfit-layered compound PbTiS3 with incommensurate modulation:Transmission electron microscopy analysis and transport properties

Shen Xi (沈希)a, Cheng Dan (程丹)b, Zhao Hao-Fei (赵豪飞)a, Yao Yuan (姚湲)a, Liu Xiao-Yang (刘晓旸)b, Yu Ri-Cheng (禹日成)a
a Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
b State Key Laboratory of Inorganic Synthesis and Preparative Chemistry, Jilin University, Changchun 130021, China
Abstract  The microstructural characteristic of the misfit-layered compound PbTiS3 has been studied with transmission electron microscopy. All the incommensurate modulation-induced satellite spots and main diffraction spots of basic sublattices can be indexed systematically with a superspace group method. Finally, the relationship between the electronic transport properties and the crystal structure is discussed.
Keywords:  incommensurate modulation      misfit-layered sulfide      transmission electron microscopy  
Received:  24 May 2013      Revised:  27 July 2013      Accepted manuscript online: 
PACS:  61.44.Fw (Incommensurate crystals)  
  68.37.Lp (Transmission electron microscopy (TEM))  
  68.37.Og (High-resolution transmission electron microscopy (HRTEM))  
  61.05.J- (Electron diffraction and scattering)  
Fund: Project supported by the National Basic Research Program of China (Grant No. 2012CB932302), the National Natural Science Foundation of China (Grant No. 50921091), and the Specific Funding of the Discipline and Graduate Education Project of Beijing Municipal Commission of Education, China.
Corresponding Authors:  Yu Ri-Cheng     E-mail:  rcyu@aphy.iphy.ac.cn

Cite this article: 

Shen Xi (沈希), Cheng Dan (程丹), Zhao Hao-Fei (赵豪飞), Yao Yuan (姚湲), Liu Xiao-Yang (刘晓旸), Yu Ri-Cheng (禹日成) Misfit-layered compound PbTiS3 with incommensurate modulation:Transmission electron microscopy analysis and transport properties 2013 Chin. Phys. B 22 116102

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