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Interfacial characteristics of Al/Al2O3/ZnO/n-GaAs MOS capacitor |
Liu Chen (刘琛), Zhang Yu-Ming (张玉明), Zhang Yi-Men (张义门), Lü Hong-Liang (吕红亮) |
School of Microelectronics, Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, Xidian University, Xi'an 710071, China |
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Abstract The interfacial characteristics of Al/Al2O3/ZnO/n-GaAs metal-oxide-semiconductor (MOS) capacitor are investigated. The results measured by X-ray photoelectron spectroscopy (XPS) and high-resolution transmission electron microscopy (HRTEM) show that the presence of ZnO can effectively suppress the formations of oxides at the interface between the GaAs and gate dielectric and gain smooth interface. The ZnO-passivated GaAs MOS capacitor exhibits a very small hysteresis and frequency dispersion. Using the Terman method, the interface trap density is extracted from C-V curves. It is found that the ZnO layer can effectively improve the interface quality.
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Received: 27 August 2012
Revised: 12 March 2013
Accepted manuscript online:
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PACS:
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67.30.hp
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(Interfaces)
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68.37.-d
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(Microscopy of surfaces, interfaces, and thin films)
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61.72.uj
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(III-V and II-VI semiconductors)
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Fund: Project supported by the National Basic Research Program of China (Grant No. 2010CB327505), the National Defense Advance Research Foundation, China(Grant No. 9140A08030511DZ111), and the National Defense Advance Research Project, China (Grant No. 51308030306). |
Corresponding Authors:
Liu Chen
E-mail: lcxd710071@126.com
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Cite this article:
Liu Chen (刘琛), Zhang Yu-Ming (张玉明), Zhang Yi-Men (张义门), Lü Hong-Liang (吕红亮) Interfacial characteristics of Al/Al2O3/ZnO/n-GaAs MOS capacitor 2013 Chin. Phys. B 22 076701
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