Abstract The microstructure modifications of sodium silicate glass induced by 1.2-MeV electron irradiation are studied by x-ray photoelectron spectroscopy and Raman spectroscopy. Depth profile analyses are also performed on the irradiated glass at 109 Gy. A sodium-depleted layer with a thickness of a few tens of nanometers and the corresponding increase of network polymerization on the top surface are observed after electron bombardment, while the polymerization in the subsurface region has a negligible variation with the irradiation dose. Moreover, the formation of molecular oxygen after electron irradiation is evidenced, which is mainly aggregated in the first two-micron-thick irradiated glass surface. These modifications are correlated to the network relaxation process as a consequence of the diffusion and desorption of sodium species during electron irradiation.
Corresponding Authors:
Wang Tie-Shan
E-mail: tswang@lzu.edu.cn
Cite this article:
Chen Liang (陈亮), Wang Tie-Shan (王铁山), Zhang Gen-Fa (张根发), Yang Kun-Jie (杨坤杰), Peng Hai-Bo (彭海波), Zhang Li-Min (张利民) XPS and Raman studies of electron irradiated sodium silicate glass 2013 Chin. Phys. B 22 126101
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