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Chin. Phys. B, 2012, Vol. 21(8): 088502    DOI: 10.1088/1674-1056/21/8/088502
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Prev   Next  

Fabrication and characterization of 4H–SiC bipolar junction transistor with double base epilayer

Zhang Qian (张倩), Zhang Yu-Ming (张玉明), Yuan Lei (元磊), Zhang Yi-Men (张义门), Tang Xiao-Yan (汤晓燕), Song Qing-Wen (宋庆文 )
School of Microelectronics, Key Laboratory of Semiconductor Wide Band-Gap Materials and Devices, Xidian University, Xi'an 710071, China
Abstract  In this paper we report on a novel structure of 4H-SiC bipolar junction transistor with a double base epilayer that is continuously grown. The measured dc common-emitter current gain is 16.8 at IC=28.6 mA (JC=183.4 A/cm2), and it increases with the collector current density increasing. The specific on-state resistance (Rsp-on) is 32.3 mΩ·cm2 and the open-base breakdown voltage reaches 410 V. The emitter N-type specific contact resistance and N + emitter layer sheet resistance are 1.7× 10-3 Ω·cm2 and 150 Ω /□, respectively.
Keywords:  4H-SiC      bipolar junction transistors      common-emitter current gain      specific on-resistance      open-base breakdown voltage  
Received:  08 December 2011      Revised:  13 January 2012      Accepted manuscript online: 
PACS:  85.30.Pq (Bipolar transistors)  
  51.50.+v (Electrical properties)  
  78.40.Fy (Semiconductors)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 60876061) and the National Defense Key Laboratory Foundation from Nanjing National Defense Key Laboratory of Nanjing Electronic Devices Institute, China (Grant No. 20090C1403).
Corresponding Authors:  Zhang Qian     E-mail:  zhangqian4213@126.com

Cite this article: 

Zhang Qian (张倩), Zhang Yu-Ming (张玉明), Yuan Lei (元磊), Zhang Yi-Men (张义门), Tang Xiao-Yan (汤晓燕), Song Qing-Wen (宋庆文 ) Fabrication and characterization of 4H–SiC bipolar junction transistor with double base epilayer 2012 Chin. Phys. B 21 088502

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