Chin. Phys. B
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Chin. Phys. B  2016, Vol. 25 Issue (3): 037303    DOI: 10.1088/1674-1056/25/3/037303
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index
Xu-Feng Li(李旭峰)1, Wei Peng(彭伟)2, Ya-Li Zhao(赵亚丽)3, Qiao Wang(王乔)2, Ji-Lin Wei(魏计林)1
1. School of Applied Science, Taiyuan University of Science and Technology, Taiyuan 030024, China;
2. School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024, China;
3. No. 33 Research Institute of China Electronics Technology Group Corporation, Taiyuan 030024, China

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