Chin. Phys. B
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Chin. Phys.  2006, Vol. 15 Issue (10): 2431-2438    DOI: 10.1088/1009-1963/15/10/041
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Evaluation of negative bias temperature instability in ultra-thin gate oxide pMOSFETs using a new on-line PDO method
Ji Zhi-Gang, Xu Ming-Zhen, Tan Chang-Hua
Department of Microelectronics, Peking University, Beijing 100871, China

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