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Acta Physica Sinica (Overseas Edition), 1995, Vol. 4(4): 259-267    DOI: 10.1088/1004-423X/4/4/004
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

EFFECT OF HIGH-ANGLE DIFFRACTION DATA ON RIETVELD STRUCTURE REFINEMENT

CHEN XIAO-LONG (陈小龙), LIANG JING-KUI (梁敬魁), WANG CHONG (王聪)
Institute of Physics, Academia Sinica, Beijing 100080, China
Abstract  By utilizing the powder X-ray step-scanning diffraction data of PbSO4, we have studied the effect of the diffraction data (with different high-angle upper-limit: 2$\theta$m= 160,140,120,100,80, 70 and 60°) on the precision of the Rietveld refined lattice constants, structure parameters, and agreement indices. Tbese refined results are compared with those obtained from the single crystal data. It is revealed that the deviations of the refined lattice constants, atomic positions and isotropic temperature factors decrease, and agreement indices become smaller With the increase of 2$\theta$m. But when 2$\theta$m> 120°, the deviations and agreement indices decrease very slowly. Therefore, in general cases, 2$\theta$m should be taken to be 120°or larger in order to get satisfactory refined results in the Rietveld crystal structure refinement.
Received:  13 September 1994      Accepted manuscript online: 
PACS:  61.05.cp (X-ray diffraction)  
  61.66.Fn (Inorganic compounds)  

Cite this article: 

CHEN XIAO-LONG (陈小龙), LIANG JING-KUI (梁敬魁), WANG CHONG (王聪) EFFECT OF HIGH-ANGLE DIFFRACTION DATA ON RIETVELD STRUCTURE REFINEMENT 1995 Acta Physica Sinica (Overseas Edition) 4 259

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