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Chin. Phys. B, 2010, Vol. 19(9): 090701    DOI: 10.1088/1674-1056/19/9/090701
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Spectroscopic ellipsometric study of the optical properties of Ag2O film prepared by direct-current magnetron reactive sputtering

Gao Xiao-Yong, Feng Hong-Liang, Ma Jiao-Min, Zhang Zeng-Yuan
The Key Laboratory of Material Physics of Ministry of Education, School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China
Abstract  The Ag2O film, as-deposited by direct-current magnetron reactive sputtering at a substrate temperature of 150 ℃, clearly shows a preferential orientation (111), and is capable of lowering the threshold value of the thermal decomposition temperature to about 200 ℃, which is helpful to its application in optical and magneto-optical storage. This paper fits its optical constants in terms of a general oscillator model by using measured ellipsometric parameters. The fitted oscillator energy 2.487 eV is close to the optical direct interband transition energy value of the Ag2O film determined by Tauc equation; whereas, the fitted oscillator energy 4.249 eV is far from the fitted plasma oscillator energy 4.756 eV by single-oscillator energy. The photoluminescence spectrum centred at about 2.31 eV indicates a direct-energy gap photoluminescence mechanism of the Ag2O film.
Keywords:  Ag2O film      spectroscopic ellipsometry      general oscillator model      single-oscillator model  
Received:  15 October 2009      Revised:  09 December 2009      Published:  15 September 2010
PACS:  0760F  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 60807001) and Foundation of Henan Educational Committee (Grant No. 2010A140017).

Cite this article: 

Gao Xiao-Yong, Feng Hong-Liang, Ma Jiao-Min, Zhang Zeng-Yuan Spectroscopic ellipsometric study of the optical properties of Ag2O film prepared by direct-current magnetron reactive sputtering 2010 Chin. Phys. B 19 090701

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