Physical origin of observed nonlinearities in Poly (1-naphthyl methacrylate)：Using a single transistor–transistor logic modulated laser beam

doi:10.1088/1674-1056/22/11/114209

Abstract A thermal lens technique is adopted using a single modulated continuous wave (cw) 532-nm laser beam to evaluate the nonlinear refractive index n₂, and the thermo-optic coefficient dn/dT, in polymer Poly (1-naphthyl methacrylate) (P-1-NM) dissolved in chloroform, tetrahydrofuran (THF), and dimethyl sulfoxide (DMSO) solvents. The results are compared with Z-scan and diffraction ring techniques. The comparison reveals the effectiveness and the simplicity of the TTL modulation technique. The physical origin is discussed for the obtained results.

Keywords: nonlinear refractive index thermo-optic coefficient self-phase modulation nonlinear optics

Received: 16 March 2013
Revised: 01 May 2013
Accepted manuscript online:

PACS:	42.65.Jx	(Beam trapping, self-focusing and defocusing; self-phase modulation)
	42.70.Nq	(Other nonlinear optical materials; photorefractive and semiconductor materials)
	78.20.Nv
	78.66.Qn	(Polymers; organic compounds)

Corresponding Authors: Hussain A. Badran
E-mail: badran_hussein@yahoo.com

Cite this article:

Qusay M. A. Hassan, Hussain A. Badran, Alaa Y. AL-Ahmad, Chassib A. Emshary Physical origin of observed nonlinearities in Poly (1-naphthyl methacrylate)：Using a single transistor–transistor logic modulated laser beam 2013 Chin. Phys. B 22 114209

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Physical origin of observed nonlinearities in Poly (1-naphthyl methacrylate)：Using a single transistor–transistor logic modulated laser beam

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