Solid-gas interface thermal conductance for the thermal barrier coating with surface roughness: The confinement effect
Xue Zhao(赵雪)1 and Jin-Wu Jiang(江进武)1,2,†
1 Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai Institute of Applied Mathematics and Mechanics, School of Mechanics and Engineering Science, Shanghai University, Shanghai 200072, China; 2 Zhejiang Laboratory, Hangzhou 311100, China
Abstract The yttria-stabilized zirconia (YSZ) is a famous thermal barrier coating material to protect hot-end components of an engine. As a characteristic feature of the YSZ, the surface roughness shall play an important role in the interface thermal conductance between the YSZ and gas, considering that the gas is typically at an extremely high temperature. We investigate the effect of the surface roughness on the thermal conductance of the YSZ-gas interface with surface roughness described by nanoscale pores on the surface of the YSZ. We reveal two competitive mechanisms related to the microstructure of the pore, i.e., the actual contact area effect and the confinement effect. The increase of the pore depth will enlarge the actual contact area between the YSZ and gas, leading to enhancement of the solid-gas interface thermal conductance. In contrast to the positive actual contact area effect, the geometry-induced confinement effect greatly reduces the interface thermal conductance. These findings shall offer some fundamental understandings for the microscopic mechanisms of the YSZ-gas interface thermal conductance.
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 11822206 and 12072182), the Innovation Program of the Shanghai Municipal Education Commission (Grant No. 2017-01-07-00-09-E00019), the Key Research Project of Zhejiang Laboratory, and the National Supercomputing Center in Zhengzhou (Grant No. 2021PE0AC02).
Xue Zhao(赵雪) and Jin-Wu Jiang(江进武) Solid-gas interface thermal conductance for the thermal barrier coating with surface roughness: The confinement effect 2022 Chin. Phys. B 31 126802
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