GaN-based yellow light-emitting diodes (LEDs) on Si substrates are aged at a direct current density of 50 A/cm2 for 500 h. After the aging process, it can be found that the LEDs have a stable electrical property but their light output power is decayed by 4.01% at 35 A/cm2. Additionally, the aging mechanism of GaN-based yellow LED is analyzed. It is found that the decay of light output power may be attributed to the following two reasons:one is the increase of Shockley-Rrad-Hall recombination and the other is the change of the transport path of holes via V-pits after aging, which may induce the radiative recombination current to decrease. In this paper, not only the aging mechanism of GaN-based yellow LED is investigated, but also a new possible research direction in LED aging is given.
Project supported by the National Natural Science Foundation for Young Scientists of China (Grant Nos. 61704069 and 51602141) and the National Key Research and Development Program of China (Grant No. 2016YFB0400601).
Progress and prospects of GaN-based LEDs using nanostructures Zhao Li-Xia (赵丽霞), Yu Zhi-Guo (于治国), Sun Bo (孙波), Zhu Shi-Chao (朱石超), An Ping-Bo (安平博), Yang Chao (杨超), Liu Lei (刘磊), Wang Jun-Xi (王军喜), Li Jin-Min (李晋闽). Chin. Phys. B, 2015, 24(6): 068506.
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