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Optical and electrical characterizations of nanoparticle Cu2S thin films |
M. Saadeldina, H. S. Solimanb, H. A. M. Alib, K. Sawabya |
a Physics Department, Faculty of Science, Cairo University, Giza 12613, Egypt; b Physics Department, Faculty of Education, Ain-Shams University, Cairo 11757, Egypt |
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Abstract Copper sulfide thin films are deposited onto different substrates at room temperature using the thermal evaporation technique. X-ray diffraction spectra show that the film has an orthorhombicchalcocite (γ-Cu2S) phase. The atomic force microscopy images indicate that the film exhibits nanoparticles with an average size of nearly 44 nm. Specrtophotometric measurements for the transmittance and reflectance are carried out at normal incidence in a spectral wavelength range of 450 nm-2500 nm. The refractive index, n, as well as the absorption index, k is calculated. Some dispersion parameters are determined. The analyses of ε1 and ε2 reveal several absorption peaks. The analysis of the spectral behavior of the absorption coefficient, α, in the absorption region reveals direct and indirect allowed transitions. The dark electrical resistivity is studied as a function of film thickness and temperature. Tellier's model is adopted for determining the mean free path and bulk resistance.
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Received: 22 June 2013
Revised: 10 September 2013
Accepted manuscript online:
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PACS:
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68.35.bg
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(Semiconductors)
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Corresponding Authors:
K.Sawaby
E-mail: phy_kamel@yahoo.com
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About author: 68.35.bg |
Cite this article:
M. Saadeldin, H. S. Soliman, H. A. M. Ali, K. Sawaby Optical and electrical characterizations of nanoparticle Cu2S thin films 2014 Chin. Phys. B 23 046803
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[1] |
Kassim A, Min H S, Siang L K and Nagalingam A 2011 Chalcogenide Lettters 8 405
|
[2] |
Yamaamoto T, Kubota E, Taniguchi A, Dev S, Tanaka K and Osakada K 1992 Chem. Mater. 4 570
|
[3] |
Sagade A A and Sharma K 2008 Sensors and Actuators B: Chemical 133 135
|
[4] |
Allouche N K, Nasr T B, Guasch C N and Turki K 2010 Comptes Rendus Chimie 13 1364
|
[5] |
Lim Y, Ok Y W, Tark S J, KangY, Kim D and Curr 2009 Appl. Phys. 9 890
|
[6] |
Itoh K, Kuzuya T and Sumiyama K 2006 Mater. Trans. 47 1953
|
[7] |
Tolansky S 1970 Multiple-beam Interference, Microscopy of Metals, (New York: Academic Press)
|
[8] |
Shklyarevski I N, Kornveeva T I and Zozula K N 1969 Opt. Spect. 27 174
|
[9] |
El-Naggar A H 1999 J. Phys. B: Condens. Matter 11 9619
|
[10] |
El-Nahass M M 1992 J. Mater. Sci. 27 6592
|
[11] |
Bakry A M and El-NaggarA H 2000 Thin Solid Films 360 293
|
[12] |
Seraphin B O 1979 Solar Energy Conversions (Berlin, Heidelberg, New York: Spring-Verlag)
|
[13] |
Freyland W, Goltzene A, Peter Grosse and Harbeke G 1983 Physics of Non-Tetrahedrally Bonded Elements and Binary Compounds (Berlin, Heidelberg, London, New York, Tokyo: Springer Verlag) p. 137
|
[14] |
Stendal A, Bechars Wilbrand U S, Stenzel O and Von Borczskowski C 1996 J. Phys. B: At. Mol. Opt. Phys. 29 2589
|
[15] |
DiDomenico M and Wemple S H 1969 J. Appl. Phys. 40 720
|
[16] |
Wemple S H and DiDomenico M 1971 Phys. Rev. B 3 1338
|
[17] |
El-Nahass M M and Youssef T E 2010 J. Alloys Compd. 503 86
|
[18] |
Ilican S and Caglar M Y 2007 J. Opto. Electr. & Adv. Mater. 9 1414
|
[19] |
Wolaton A K and Moss T S 1963 Proc. Roy. Soc. 81 5091
|
[20] |
Rajesh K R and Menon C S 2002 Mater. Lett. 53 329
|
[21] |
Bardeen J, Blatt F J and Hall L T 1956 Photoconductivity Conf. (New York: Wiley) p. 146
|
[22] |
Tauc J, Grigorovici R and Vancu A 1996 Phys. Status Solidi B 15 627
|
[23] |
Mulder B J 1973 Phys. Status Solidi 18 633
|
[24] |
Shiozawa L R, Sullivan G A and Augustine F 1967 Clevite Corporation, Cleveland, Ohio, Contract No. AF 33 615 5224
|
[25] |
Romoin M, Sorbier J P, Bretzner J F and Martinuzzi S 1969 C. R. Acad. Sci. Ser. B 268 208
|
[26] |
Mulder B J 1973 Phys. Status Solidi A 132 79
|
[27] |
Dhumure S S and Lokhands C D 1992 Sol. Energy Mater. Sol. Cells 28 159
|
[28] |
Sondheimer E H 1952 Adv. Phys. 1 1
|
[29] |
Kimr I H 2000 Mater. Lett. 44 75
|
[30] |
Tellier C R 1978 Thin Solid Films 51 311
|
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