Please wait a minute...
Chin. Phys. B, 2011, Vol. 20(3): 037305    DOI: 10.1088/1674-1056/20/3/037305
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Hot carrier injection degradation under dynamic stress

Ma Xiao-Hua(马晓华)a),Cao Yan-Rong(曹艳荣)b),Hao Yue(郝跃)c),and Zhang Yue(张月)c)
a School of Technical Physics, Xidian University, Xi'an 710071, China; b School of Electronical & Machanical Engineering, Xidian University, Xi'an 710071, China; c Key Lab of Wide Band-Gap Semiconductor Materials and Devices, Xi'an 710071, China
Abstract  In this paper, we have studied hot carrier injection (HCI) under alternant stress. Under different stress modes, different degradations are obtained from the experiment results. The different alternate stresses can reduce or enhance the HC effect, which mainly depends on the latter condition of the stress cycle. In the stress mode A (DC stress with electron injection), the degradation keeps increasing. In the stress modes B (DC stress and then stress with the smallest gate injection) and C (DC stress and then stress with hole injection under Vg=0 V and Vg=1.8 V), recovery appears in the second stress period. And in the stress mode D (DC stress and then stress with hole injection under Vg=-1.8 V and Vd=1.8 V), as the traps filled in by holes can be smaller or greater than the generated interface states, the continued degradation or recovery in different stress periods can be obtained.
Keywords:  hot carrier injection      alternate stress      recovery      degradation  
Received:  20 August 2010      Revised:  13 November 2010      Accepted manuscript online: 
PACS:  73.40.Qv (Metal-insulator-semiconductor structures (including semiconductor-to-insulator))  
  85.30.Tv (Field effect devices)  
Fund: Project supported by the National Key Science and Technology Special Project, China (Grant No. 2008ZX01002-002), the grant from the Major State Basic Research Development Program of China (973 Program, No. 2011CB309606), and the Fundamental Research Funds for the Central Universities (Grant No. JY10000904009).

Cite this article: 

Ma Xiao-Hua(马晓华), Cao Yan-Rong(曹艳荣), Hao Yue(郝跃), and Zhang Yue(张月) Hot carrier injection degradation under dynamic stress 2011 Chin. Phys. B 20 037305

[1] Tu R H, Rosenbaum E, Chan W Y, Li C C, Minami E, Quader K, Ko P K and Hu C 1993 wxIEEE Trans. Comput.-Aided Des. Integrate Circuits & Syst.12 1524
[2] Hu C, Tam S C, Hsu F C, Ko P K, Chan T Y and Terrill K W 1985 wxIEEE Trans. Electron Devices32 375
[3] Ren H X and Hao Y 2001 wxChin. Phys.10 189
[4] Liu H X and Hao Y 2002 wxChin. J. Electronics5 658
[5] Liu H X, Hao Y and Sun Z 2001 wxResearch and Progress of Solid State Electronics21 439
[6] Ma Z, Lai P and Cheng Y 1993 wxIEEE Trans. Electron Devices40 125
[7] Young P K, Sung T K, Joo T M and Kim S U 2001 wxIEEE Trans. Device and Materials Reliability2 104
[8] Igura Y, Matsuoka H and Takeda E 1989 wxIEEE Electron Device Letters10 227
[9] Zhang J F, Zhao C Z, Chen A H, Groeseneken G and Deqraeve R 2004 wxIEEE Trans. Electron Devices51 1267
[10] Zhao C Z, Zhang J F and Groeseneken G 2004 wxIEEE Trans. Electron Devices51 1274
[1] High performance SiC trench-type MOSFET with an integrated MOS-channel diode
Jie Wei(魏杰), Qinfeng Jiang(姜钦峰), Xiaorong Luo(罗小蓉), Junyue Huang(黄俊岳), Kemeng Yang(杨可萌), Zhen Ma(马臻), Jian Fang(方健), and Fei Yang(杨霏). Chin. Phys. B, 2023, 32(2): 028503.
[2] A novel algorithm to analyze the dynamics of digital chaotic maps in finite-precision domain
Chunlei Fan(范春雷) and Qun Ding(丁群). Chin. Phys. B, 2023, 32(1): 010501.
[3] Degradation and breakdown behaviors of SGTs under repetitive unclamped inductive switching avalanche stress
Chenkai Zhu(朱晨凯), Linna Zhao(赵琳娜), Zhuo Yang(杨卓), and Xiaofeng Gu(顾晓峰). Chin. Phys. B, 2022, 31(9): 097303.
[4] Fault-tolerant finite-time dynamical consensus of double-integrator multi-agent systems with partial agents subject to synchronous self-sensing function failure
Zhi-Hai Wu(吴治海) and Lin-Bo Xie(谢林柏). Chin. Phys. B, 2022, 31(12): 128902.
[5] Degradation of β-Ga2O3 Schottky barrier diode under swift heavy ion irradiation
Wen-Si Ai(艾文思), Jie Liu(刘杰), Qian Feng(冯倩), Peng-Fei Zhai(翟鹏飞), Pei-Pei Hu(胡培培), Jian Zeng(曾健), Sheng-Xia Zhang(张胜霞), Zong-Zhen Li(李宗臻), Li Liu(刘丽), Xiao-Yu Yan(闫晓宇), and You-Mei Sun(孙友梅). Chin. Phys. B, 2021, 30(5): 056110.
[6] Analysis on degradation mechanisms of normally-off p-GaN gate AlGaN/GaN high-electron mobility transistor
Si-De Song(宋思德), Su-Zhen Wu(吴素贞), Guo-Zhu Liu(刘国柱), Wei Zhao(赵伟), Yin-Quan Wang(王印权), Jian-Wei Wu(吴建伟), and Qi He(贺琪). Chin. Phys. B, 2021, 30(4): 047103.
[7] Numerical simulation of acoustic field under mechanical stirring
Jin-He Liu(刘金河), Zhuang-Zhi Shen(沈壮志), and Shu-Yu Lin(林书玉). Chin. Phys. B, 2021, 30(10): 104302.
[8] A novel method of constructing high-dimensional digital chaotic systems on finite-state automata
Jun Zheng(郑俊), Han-Ping Hu(胡汉平). Chin. Phys. B, 2020, 29(9): 090502.
[9] Power of all-fiber amplifier increasing from 1030 W to 2280 W through suppressing mode instability by increasing the seed power
Xue-Xue Luo(罗雪雪), Ru-Mao Tao(陶汝茂), Chen Shi(史尘), Han-Wei Zhang(张汉伟), Xiao-Lin Wang(王小林), Pu Zhou(周朴), Xiao-Jun Xu(许晓军). Chin. Phys. B, 2019, 28(2): 024208.
[10] Simulation of SiC radiation detector degradation
Hai-Li Huang(黄海栗), Xiao-Yan Tang(汤晓燕), Hui Guo(郭辉), Yi-Men Zhang(张义门), Yu-Tian Wang(王雨田), Yu-Ming Zhang(张玉明). Chin. Phys. B, 2019, 28(1): 010701.
[11] Damage and recovery of fiber Bragg grating under radiation environment
Shi-Zhe Wen(温世喆), Wei-Chen Xiong(熊伟晨), Li-Ping Huang(黄力平), Zhen-Rui Wang(王镇锐), Xing-Bin Zhang(张兴斌), Zhen-Hui He(何振辉). Chin. Phys. B, 2018, 27(9): 090701.
[12] Charge compensation and capacity fading in LiCoO2 at high voltage investigated by soft x-ray absorption spectroscopy
Xing-Hui Long(龙兴辉), Yan-Ru Wu(吴颜如), Nian Zhang(张念), Peng-Fei Yu(于鹏飞), Xue-Fei Feng(冯雪飞), Shun Zheng(郑顺), Jia-Min Fu(傅佳敏), Xiao-Song Liu(刘啸嵩), Na Liu(柳娜), Meng Wang(王梦), Lei-Min Xu(徐磊敏), Jin-Ming Chen(陈锦明), Jenn-Min Lee(李振民). Chin. Phys. B, 2018, 27(10): 107802.
[13] Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress
Linna Zhao(赵琳娜), Peihong Yu(于沛洪), Zixiang Guo(郭子骧), Dawei Yan(闫大为), Hao Zhou(周浩), Jinbo Wu(吴锦波), Zhiqiang Cui(崔志强), Huarui Sun(孙华锐), Xiaofeng Gu(顾晓峰). Chin. Phys. B, 2017, 26(8): 087308.
[14] Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level
Zhi-Yuan Lun(伦志远), Yun Li(李云), Kai Zhao(赵凯), Gang Du(杜刚), Xiao-Yan Liu(刘晓彦), Yi Wang(王漪). Chin. Phys. B, 2016, 25(8): 088502.
[15] Recovery of PMOSFET NBTI under different conditions
Cao Yan-Rong (曹艳荣), Yang Yi (杨毅), Cao Cheng (曹成), He Wen-Long (何文龙), Zheng Xue-Feng (郑雪峰), Ma Xiao-Hua (马晓华), Hao Yue (郝跃). Chin. Phys. B, 2015, 24(9): 097304.
No Suggested Reading articles found!