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Chinese Physics, 2004, Vol. 13(12): 2169-2173    DOI: 10.1088/1009-1963/13/12/034
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Raman properties of GaSb nanoparticles embedded in SiO2 films

Liu Fa-Min (刘发民)a, Wang Tian-Min (王天民)a, Zhang Li-De (张立德)b
a Department of Applied Physics, Centre of Materials Physics and Chemistry, School of Science, Beijing University of Aeronautics & Astronautics, Beijing 100083, China; b Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China
Abstract  The Raman shifts of nanocrystalline GaSb excited by an Ar^{+} ion laser at wavelengths 514.5, 496.5, 488.0, 476.5, and 457.9nm are studied by an SPEX-1403 laser Raman spectrometer respectively, and they are explained by phonon confinement, tensile stress, resonant Raman scattering and quantum size effects. The Stokes and anti-Stokes Raman spectra of GaSb nanocrystals strongly support the Raman feature of GaSb nanocrystals. The calculated optical spectra compare well with experimental data on Raman scattering GaSb nanocrystals.
Keywords:  GaSb nanocrystals      novel Raman properties      phonon confinement and tensile stress effects  
Received:  04 March 2004      Revised:  23 June 2004      Accepted manuscript online: 
PACS:  78.30.Fs (III-V and II-VI semiconductors)  
  78.67.Bf (Nanocrystals, nanoparticles, and nanoclusters)  
  78.66.Fd (III-V semiconductors)  
  63.22.+m  
  62.25.+g  
Fund: Project supported by the Aeronautics Science Foundation of China (Grant No 03G51069).

Cite this article: 

Liu Fa-Min (刘发民), Wang Tian-Min (王天民), Zhang Li-De (张立德) Raman properties of GaSb nanoparticles embedded in SiO2 films 2004 Chinese Physics 13 2169

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