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Chinese Physics, 2006, Vol. 15(2): 315-318    DOI: 10.1088/1009-1963/15/2/014
NUCLEAR PHYSICS Prev   Next  

A method to measure the nonlinear force caused emittance growth in a RF photoinjector

Li Zheng-Hong (李正红), Yang Zhen-Ping (杨振萍)
Science College, South-West University of Science and Technology,Mianyang, 621021, China
Abstract  Based on the multi-slit method, a new method is introduced to measure the non linear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.
Keywords:  thermal emittance      RF photoinjector      FEL (free electron laser)      multi-slit method  
Received:  15 July 2005      Revised:  02 August 2005      Accepted manuscript online: 
PACS:  41.60.Cr (Free-electron lasers)  
  29.27.Ac (Beam injection and extraction)  
  29.27.Eg (Beam handling; beam transport)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No 10347009).

Cite this article: 

Li Zheng-Hong (李正红), Yang Zhen-Ping (杨振萍) A method to measure the nonlinear force caused emittance growth in a RF photoinjector 2006 Chinese Physics 15 315

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