Abstract The influence of K4Fe(CN)6 at various doping concentrations on the photosensitivity of cubic AgCl microcrystals has been investigated by using the microwave absorption and phase-sensitive measurement technique. The time behaviour of free photoelectrons in AgCl microcrystals is analysed by using computer simulation as a function of three parameters of shallow electron trap (SET) including doping concentration, trap depth and capture cross-section (CCS). It is found that the three parameters of SET play different roles on the free photoelectron decay time (FDT). After considering the threshold effects of the three parameters and their collective effects, the trap depth value, the CCS value, and the optimal doping concentration of the SET introduced by the dopant K4Fe(CN)6 in cubic AgCl microcrystals can also be determined, and the best photosensitivity of cubic AgCl can be obtained.
Received: 28 May 2004
Revised: 27 October 2004
Accepted manuscript online:
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos 10274017 and 10354001), and the Natural Science Foundation of Hebei Province, China (Grant Nos 103097 and 603138).
Cite this article:
Li Xiao-Wei (李晓苇), Liu Rong-Juan (刘荣鹃), Geng Ai-Cong (耿爱丛), Yang Shao-Peng (杨少鹏), Fu Guang-Sheng (傅广生) The influence of K4Fe(CN)6 on the photosensitivity of cubic AgCl microcrystal 2005 Chinese Physics 14 404
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