|
|
Application of the body of revolution finite-element method in a re-entrant cavity for fast and accurate dielectric parameter measurements |
Tianqi Feng(冯天琦), Chengyong Yu(余承勇)†, En Li(李恩), and Yu Shi(石玉) |
School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China |
|
|
Abstract In dielectrometry, traditional analytical and numerical algorithms are difficultly employed in complex resonant cavities. For a special kind of structure (a rotating resonant cavity), the body of revolution finite-element method (BOR-FEM) is employed to calculate the resonant parameters and dielectric parameters. In this paper, several typical resonant structures are selected for analysis and verification. Compared with the resonance parameter values in the literature and the simulation results of commercial software, the error of the BOR-FEM calculation is less than 0.9% and a single solution time is less than 1 s. Reentrant coaxial resonant cavities loaded with dielectric materials are analyzed using this method and compared with simulation results, showing good agreement. Finally, in this paper, the established BOR-FEM method is successfully applied with a machined cavity for the accurate measurement of the complex dielectric constant of dielectric materials. The test specimens were machined from polytetrafluoroethylene, fused silica and Al2O3, and the test results showed good agreement with the literature reference values.
|
Received: 18 February 2022
Revised: 14 June 2022
Accepted manuscript online: 08 July 2022
|
PACS:
|
01.40.gf
|
(Theory of testing and techniques)
|
|
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 62001083) and the Guangdong Provincial Key Research and Development Project, China (Grant No. 2020B010179002). |
Corresponding Authors:
Chengyong Yu
E-mail: yu_cyong@163.com
|
Cite this article:
Tianqi Feng(冯天琦), Chengyong Yu(余承勇), En Li(李恩), and Yu Shi(石玉) Application of the body of revolution finite-element method in a re-entrant cavity for fast and accurate dielectric parameter measurements 2023 Chin. Phys. B 32 030101
|
[1] Holzman E L 2006 IEEE Trans. Microw. Theory 54 3127 [2] Deshpande M D, Reddy C J, Tiemsin P I, et al. 1997 IEEE Trans. Microw. Theory 45 359 [3] Santra M and Limaye K U 2005 IEEE Trans. Microw. Theory 53 718 [4] Baker-Jarvis J, Janezic M D and DeGroot D C 2010 IEEE Instrum. Meas. Mag. 13 24 [5] Kaatze U and Hubner C 2010 Meas. Sci. Technol. 21 082001 [6] Kaatze U 2010 Metrologia 47 S91 [7] Krupka J 2006 Meas. Sci. Technol. 17 R55 [8] Le Floch J M, Fan Y, Humbert G, et al. 2014 Rev. Sci. Instrum. 85 031301 [9] Janezic M D and Baker-Jarvis J 1999 IEEE Trans. Microw. Theory 47 2014 [10] Janezic M D and Grosvenor J H 1991 Conference Record. IEEE Instrumentation and Measurement Technology Conference, May 14-16, 1991, p. 580 [11] Geyer R G, Kabos P and Baker-Jarvis J 2002 IEEE Trans. Instrum. Meas. 51 383 [12] Costa F, Monorchio A, Amabile C, et al. 2011 2011 41st European Microwave Conference, October 10-13, 2011, p. 945 [13] Xiang Y H, Huang J, Fu L L, et al. 2021 IEEE Sens. J. 21 10657 [14] Penaranda-Foix F L, Catala-Civera J M, Canos-Marin A J, et al. 2009 2009 IEEE MTT-S International Microwave Symposium Digest, June 7-12, 2009, p. 1309 [15] Zhou Y, Li E, Guo G F, et al. 2011 Aerospace Materials & Technology 41 60 (in Chinese) [16] Guo Y F, Zhang Z C and Fu C J 2011 High Power Laser and Particle Beams 23 731 [17] Marques-Villarroya D, Penaranda-Foix F, Garcia-Banos B, et al. 2017 2017 47th European Microwave Conference (EuMC), October 10-12, 2017, p. 440 [18] Fan Y H, Zhang Z Y, Carvalho N C, et al. 2014 IEEE Trans. Microw. Theory 62 1657 [19] Barroso J J, Castro P J, Neto J P L, et al. 2005 SBMO/IEEE MTT-S International Conference on Microwave and Optoelectronics, 2005. July 25, 2005, p. 129 [20] Xi W G and Tinga W R 1992 IEEE Trans. Microw. Theory 40 1927 [21] Wexler A 1967 IEEE Trans. Microw. Theory 15 508 [22] Khodja A, Tounsi M L and Lamhene Y 2002 2002 3rd International Conference on Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. August 17-19, 2002, p. 630 [23] Marques-Villarroya D, Penaranda-Foix F L, Garcia-Banos B, et al. 2017 IEEE Trans. Microw. Theory 65 1191 [24] Penaranda-Foix F L, Janezic M D, Catala-Civera J M, et al. 2012 IEEE Trans. Microw. Theory 60 2730 [25] Lech R and Mazur L 2007 IEEE Trans. Microw. Theory 55 2115 [26] Thompson F, Haigh A D, Dillon B M, et al. 2003 IEE Proc. - Sci. Meas. Technol. 150 113 [27] Kanai Y, Tsukamoto T, Miyakawa M, et al. 2000 IEEE Trans. Magn. 36 1750 [28] Hano M 1984 IEEE Trans. Microw. Theory 32 1275 [29] Zhang C F, Wang W, An S G, et al. 2021 Chin. Phys. B 30 010101 [30] Castiblanco J A, Seetharamdoo D, Berbineau M, et al. 2015 IEEE Trans. Antenn. Propag. 63 1086 [31] Jia P H, Liu Q H, Chen Y P, et al. 2020 IEEE Trans. Antenn. Propag. 68 4753 [32] Dunn E A, Byun J K, Branch E D, et al. 2006 IEEE Trans. Antenn. Propag. 54 945 [33] Zhou Q, Lin S P, Zhang P, et al. 2019 Acta Phys. Sin. 68 147104 (in Chinese) [34] Zhu Z H, Chen M S, Wu X L, et al. 2014 Computer Technology and Development 24 51 (in Chinese) [35] Mumcu G, Sertel K and Volakis J L 2008 IEEE Trans. Microw. Theory 56 217 [36] Jin J M 2002 The Finite Element Method in Electromagnetics, 2nd Edition (New York: John Wiley & Sons) p. 193 [37] Greenwood A D and Jin J M 1999 IEEE Trans. Antenn. Propag. 47 620 [38] Graglia R D, Wilton D R and Peterson A F 1997 IEEE Trans. Antenn. Propag. 45 329 [39] Kameari A 1990 IEEE Trans. Magn. 26 466 [40] Webb J P and Forgahani B 1993 IEEE Trans. Magn. 29 1495 [41] Stewart G W 2002 SIAM J. Matrix Analysis Appl. 23 601 [42] Stewart G W 2000 Math Comput. 69 1309 [43] Monsoriu J A, Andres M V, Silvestre E, et al. 2002 IEEE Trans. Microw. Theory 50 2545 [44] Catala-Civera J M, Canós A J, Plaza-González P, et al. 2015 IEEE Trans. Microw. Theory 63 2905 [45] Yu C Y, Tu Y H, Zhang Y P, et al. 2021 IEEE Access 9 14807 [46] Gutiérrez-Cano J D, Plaza-González P, Canós A J, et al. 2020 IEEE Trans. Instrum. Meas. 69 3595 |
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|