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Chin. Phys. B, 2021, Vol. 30(8): 087301    DOI: 10.1088/1674-1056/abe3e4

Accurate capacitance-voltage characterization of organic thin films with current injection

Ming Chu(褚明)1, Shao-Bo Liu(刘少博)1, An-Ran Yu(蔚安然)2,†, Hao-Miao Yu(于浩淼)3, Jia-Jun Qin(秦佳俊)4, Rui-Chen Yi(衣睿宸)1, Yuan Pei(裴远)1, Chun-Qin Zhu(朱春琴)1, Guang-Rui Zhu(朱光瑞)1, Qi Zeng(曾琪)5, and Xiao-Yuan Hou(侯晓远)1,‡
1 State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433, China;
2 State Key Laboratory of ASIC and System, Center of Micro-Nano System, SIST, Fudan University, Shanghai 200433, China;
3 Key Laboratory of Luminescence and Optical Information, Ministry of Education, School of Science, Beijing Jiaotong University, Beijing 100044, China;
4 Department of Physics, Chemistry and Biology(IFM), Linköping University, Linköping SE-581 83, Sweden;
5 School of Material Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
Abstract  To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when current injection is significant, a three-element equivalent circuit model is proposed. On this basis, the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method. The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor, a diode, and a resistor. Moreover, the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result, and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode. This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.
Keywords:  current injection      organic thin film      capacitance-voltage      parasitic resistance  
Received:  23 December 2020      Revised:  27 January 2021      Accepted manuscript online:  07 February 2021
PACS:  73.23.Ra (Persistent currents)  
  73.61.Le (Other inorganic semiconductors)  
  84.37.+q (Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.))  
  73.40.Cg (Contact resistance, contact potential)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 11874007 and 12074076).
Corresponding Authors:  An-Ran Yu, Xiao-Yuan Hou     E-mail:;

Cite this article: 

Ming Chu(褚明), Shao-Bo Liu(刘少博), An-Ran Yu(蔚安然), Hao-Miao Yu(于浩淼), Jia-Jun Qin(秦佳俊), Rui-Chen Yi(衣睿宸), Yuan Pei(裴远), Chun-Qin Zhu(朱春琴), Guang-Rui Zhu(朱光瑞), Qi Zeng(曾琪), and Xiao-Yuan Hou(侯晓远) Accurate capacitance-voltage characterization of organic thin films with current injection 2021 Chin. Phys. B 30 087301

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