Please wait a minute...
Chin. Phys. B, 2015, Vol. 24(9): 090601    DOI: 10.1088/1674-1056/24/9/090601
GENERAL Prev   Next  

Standardization of proton-induced x-ray emission technique for analysis of thick samples

Shad Alia, Johar Zeba, Abdul Ahadb, Ishfaq Ahmadb, M. Haneefa, Jehan Akbara
a Department of Physics Hazara University, Mansehra, Pakistan;
b National Center of Physics (NCP), Islamabad, Pakistan
Abstract  This paper describes the standardization of the proton-induced x-ray emission (PIXE) technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials (SRMs) were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 MeV obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.
Keywords:  standardization      thick samples      PIXE analysis  
Received:  16 March 2015      Revised:  04 May 2015      Accepted manuscript online: 
PACS:  06.20.fb (Standards and calibration)  
  96.50.Pw (Particle acceleration)  
  78.70.Dm (X-ray absorption spectra)  
  92.20.Wx (Trace elements)  
Corresponding Authors:  Jehan Akbar     E-mail:  Jehan@hu.edu.pk

Cite this article: 

Shad Ali, Johar Zeb, Abdul Ahad, Ishfaq Ahmad, M. Haneef, Jehan Akbar Standardization of proton-induced x-ray emission technique for analysis of thick samples 2015 Chin. Phys. B 24 090601

[1] Johansson S A E and Johansson T B 1976 Nuclear Intrument and Methods 137 473
[2] Johansson S A E, Campbell J L and Malmqvist K G 1995 Particle-Induced X-ray Emission Spectroscopy (New York: John Willey & Sons) pp. 147-412
[3] Ene A, Popescu I V, Stihi C, Gheboianu A, Pantelica A and Petre C 2009 Rom. Jour. Phy 55 806
[4] Cohen D D, Siegele R, Orlic I and Stelcer E 2001 Long Term Accuracy and Precision of PIXE and PIGI Measurments for Thin and Thick Sample Analysis, June 8-12, 2001, Menai, Australia, p. 1
[5] Kasahara M, Ogiwara G, Yamamoto K, Park J H and Takahashi 1994 Int. Journal of PIXE 4 155
[6] Nejedly Z and Campbell J L 2000 Nuclear Instruments and Methods in Physics Research B 160 415
[7] Kabir M H 2007 Particle Induced X-ray Emission (PIXE) Setup and Quantitative Elemental Analysis (Ph. D. Dissertation) (Kochi: University of Technology Japan)
[8] Govil M 2001 Current Science 80 1542
[9] Johansson S A E and Compbell J L 1988 PIXE: A Noval Technique for Elemental Analysis (Chechister: John Wiley & Sons) p. 28
[10] Czamamske G K, Sisson T W, Campbell J L and Teesdale W J 1993 American Mineralogist 78 893
[11] Shariff A, Bulow K, Elfman M, Kristiansson P, Malmqvist K and Pallon J 2002 Nuclear Instruments and Methods in Physics Research B 189 131
[1] Dynamic range and linearity improvement for zero-field single-beam atomic magnetometer
Kai-Feng Yin(尹凯峰), Ji-Xi Lu(陆吉玺), Fei Lu(逯斐), Bo Li(李博), Bin-Quan Zhou(周斌权), and Mao Ye(叶茂). Chin. Phys. B, 2022, 31(11): 110703.
[2] Generation of stable and tunable optical frequency linked to a radio frequency by use of a high finesse cavity and its application in absorption spectroscopy
Yueting Zhou(周月婷), Gang Zhao(赵刚), Jianxin Liu(刘建鑫), Xiaojuan Yan(闫晓娟), Zhixin Li(李志新), Weiguang Ma(马维光), and Suotang Jia(贾锁堂). Chin. Phys. B, 2022, 31(6): 064206.
[3] Real-time frequency transfer system over ground-to-satellite link based on carrier-phase compensation at 10-16 level
Hui-Jian Liang(梁慧剑), Shi-Guang Wang(王时光), Yu Bai(白钰), Si-Chen Sun(孙思忱), and Li-Jun Wang(王力军). Chin. Phys. B, 2021, 30(8): 080601.
[4] Ring artifacts correction based on the projection-field in neutron CT
Sheng-Xiang Wang(王声翔), Jie Chen(陈洁), Zhi-Jian Tan(谭志坚), Si-Hao Deng(邓司浩), Yao-Da Wu(吴耀达), Huai-Le Lu(卢怀乐), Shou-Ding Li(李守定), Wei-Chang Chen(陈卫昌), and Lun-Hua He(何伦华). Chin. Phys. B, 2021, 30(5): 050601.
[5] Quadruple-stacked Nb/NbxSi1-x/Nb Josephson junctions for large-scale array application
Wenhui Cao(曹文会), Jinjin Li(李劲劲), Lanruo Wang(王兰若), Yuan Zhong(钟源), Qing Zhong(钟青). Chin. Phys. B, 2020, 29(6): 067404.
[6] Optimization of laser focused atomic deposition by channeling
Jie Chen(陈杰), Jie Liu(刘杰), Li Zhu(朱立), Xiao Deng(邓晓), Xinbin Cheng(陈鑫彬), Tongbao Li(李同保). Chin. Phys. B, 2020, 29(2): 020601.
[7] Amorphous Si critical dimension structures with direct Si lattice calibration
Ziruo Wu(吴子若), Yanni Cai(蔡燕妮), Xingrui Wang(王星睿), Longfei Zhang(张龙飞), Xiao Deng(邓晓), Xinbin Cheng(程鑫彬), Tongbao Li(李同保). Chin. Phys. B, 2019, 28(3): 030601.
[8] An efficient calibration method for SQUID measurement system using three orthogonal Helmholtz coils
Hua Li(李华), Shu-Lin Zhang(张树林), Chao-Xiang Zhang(张朝祥), Xiang-Yan Kong(孔祥燕), Xiao-Ming Xie(谢晓明). Chin. Phys. B, 2016, 25(6): 068501.
[9] Developing Josephson junction array chips for microvolt applications
Wenhui Cao(曹文会), Jinjin Li(李劲劲), Yuan Zhong(钟源), Yuan Gao(高原), Honghui Li(李红晖), Zengmin Wang(王曾敏), Qing He(贺青). Chin. Phys. B, 2016, 25(5): 057401.
[10] Fabrication and measurement of traceable pitch standard with a big area at trans-scale
Deng Xiao (邓晓), Li Tong-Bao (李同保), Lei Li-Hua (雷李华), Ma Yan (马艳), Ma Rui (马蕊), Weng Jun-Jing (翁浚婧), Li Yuan (李源). Chin. Phys. B, 2014, 23(9): 090601.
[11] Review of chip-scale atomic clocks based on coherent population trapping
Wang Zhong (汪中). Chin. Phys. B, 2014, 23(3): 030601.
[12] Elaborate calibration procedure for cell irradiation at the CAS-LIBB single-particle microbeam
Hu Zhi-Wen (胡智文), Ding Ke-Jian (丁克俭), Yu Liang-Deng (余量登), Zhang Jun (张俊), Wu Li-Jun (吴李君), Yu Zeng-Liang (余增亮). Chin. Phys. B, 2006, 15(4): 659-664.
[13] Characterization of a nano line width reference material based on metrological scanning electron microscope
Fang Wang(王芳), Yushu Shi(施玉书), Wei Li(李伟), Xiao Deng(邓晓), Xinbin Cheng(程鑫彬), Shu Zhang(张树), and Xixi Yu(余茜茜). Chin. Phys. B, 2022, 31(5): 050601.
[14] Precision measurement and suppression of low-frequency noise in a current source with double-resonance alignment magnetometers
Jintao Zheng(郑锦韬), Yang Zhang(张洋), Zaiyang Yu(鱼在洋), Zhiqiang Xiong(熊志强), Hui Luo(罗晖), and Zhiguo Wang(汪之国). Chin. Phys. B, 2023, 32(4): 040601.
No Suggested Reading articles found!