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Numerical analysis of surface plasmon nanocavities formed in thickness-modulated metal-insulator-metal waveguides |
Liu Jian-Long(刘建龙)a), Lin Jie(林杰)b), Zhao Hai-Fa(赵海发)a), Zhang Yan(张岩)c), and Liu Shu-Tian(刘树田) a)† |
a Department of Physics, Harbin Institute of Technology, Harbin 150001, China; b School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China; c Department of Physics, Capital Normal University, Beijing 100037, China |
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Abstract The enhancement characteristics of the local field in the surface plasmon nanocavities are investigated numerically. The cavity is constructed by placing a defect structure in the thickness-modulated metal--insulator--metal waveguide Bragg gratings. The characteristic impedance based transfer matrix method is used to calculate the transmission spectra and the resonant wavelength of the cavities with various geometric parameters. The finite-difference time-domain method is used to obtain the field pattern of the resonant mode and validate the results of the transfer matrix method. The calculation and simulation results reveal the existence of resonant wavelength shift and intensity variation with structural parameters, such as the modulation period of the gratings, the length and the width of the defect structure. Both numerical analysis and theoretical interpretation on these phenomena are given in details.
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Received: 30 May 2009
Revised: 18 September 2009
Accepted manuscript online:
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PACS:
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42.82.Et
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(Waveguides, couplers, and arrays)
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42.82.Bq
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(Design and performance testing of integrated-optical systems)
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02.60.Dc
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(Numerical linear algebra)
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02.70.Bf
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(Finite-difference methods)
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Fund: Project supported by the National
Natural Science Foundation of China (Grant Nos.~10674038 and
10604042), and the National Basic Research Program of China (Grant
No.~2006CB302901). |
Cite this article:
Liu Jian-Long(刘建龙), Lin Jie(林杰), Zhao Hai-Fa(赵海发), Zhang Yan(张岩), and Liu Shu-Tian(刘树田) Numerical analysis of surface plasmon nanocavities formed in thickness-modulated metal-insulator-metal waveguides 2010 Chin. Phys. B 19 054201
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