Cluster-assisted generation of multicharged ions in nanosecond laser ionization of carbon bisulfide clusters at 1064nm
Xiao Xue(肖雪)a), Li Hai-Yang(李海洋)b)†, Niu Dong-Mei(牛冬梅)a)b), and Luo Xiao-Lin(罗晓琳)a)b)
a Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China; b Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China
Abstract The photoionization of seeded carbon bisulfide molecular beam by a 1064 nm nanosecond Nd-YAG laser with intensities varying from to W/cm have been studied by time-of-flight mass spectrometry. Multiply charged ions of S ( = 2--6) and C ( = 2--4) with kinetic energy of hundreds of electron volts have been observed, and there are strong experimental evidences indicating that those multicharged ions originate from the ionization of CS neat clusters in the beam. An electron recolliding ionization model is proposed to explain the appearance of those multiply charged atomic ions under such low laser intensities.
(Autoionization, photoionization, and photodetachment)
Fund: Project supported by the National
Natural Science Foundation of China (Grant No 20573111) and the
Centre for Computational Science, Hefei Institutes of Physics, China
(Grant No 0331405002).
Cite this article:
Xiao Xue(肖雪), Li Hai-Yang(李海洋), Niu Dong-Mei(牛冬梅), and Luo Xiao-Lin(罗晓琳) Cluster-assisted generation of multicharged ions in nanosecond laser ionization of carbon bisulfide clusters at 1064nm 2007 Chinese Physics 16 3655
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