Chin. Phys. B
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Chin. Phys. B  2014, Vol. 23 Issue (5): 057305    DOI: 10.1088/1674-1056/23/5/057305
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Model of hot-carrier induced degradation in ultra-deep sub-micrometer nMOSFET
Lei Xiao-Yia, Liu Hong-Xiaa, Zhang Yuea, Ma Xiao-Huaa b, Hao Yuea
a Key Laboratory of Wide Bandgap Semiconductor Materials and Devices of Ministry of Education, State Key Discipline Laboratory of Wide Bandgap Semiconductor Technologies, School of Microelectronics, Xidian University, Xi'an 710071, China;
b School of Technical Physics, Xidian University, Xi'an 710071, China

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