Research on CeO2 cap layer for YBCO-coated conductor
Shi Dong-Qia, Ko Rock-Kilb, Kim Ho-Supb, Chung Jun-Kib, Song Kyu-Jeongcb, Park Chanc, Ma Pingd
a Institute for Superconducting and Electronic Materials, University of Wollongong, Australia; b Korea Electrotechnology Research Institute, Changwon,Kyungnam,Korea; c School of Materials Science {& Engineering, College of Engineering, Seoul National University, Seoul 151-744, Korea; d State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
Abstract Two groups of coated conductor samples with different
thicknesses of CeO2 cap layers deposited by pulsed laser
deposition (PLD) under the same conditions have been studied. Of
them, one group is of CeO2 films, which are deposited on
stainless steel (SS) tapes coated by IBAD-YSZ (IBAD-YSZ/SS), and
the other group is of CeO2/YSZ/Y2O3 multi-layers,
which are deposited on NiW substrates by PLD for the fabrication
of YBCO-coated conductor through the RABiTS approach. YBCO film
is then deposited on the tops of both types of buffer layers by
PLD. The effects of the thickness of the CeO$_{2}$ film on the
texture of the CeO2 film and the critical current density
(Jc) of the YBCO film are analysed. For the case of
CeO2 film on IBAD-YSZ/SS, there appears a self-epitaxy
effect with increasing thickness of the CeO2 film. For
CeO2/YSZ/Y2O3/NiW, in which the buffer layers are
deposited by PLD, there occurs no self-epitaxy effect, and the
optimal thickness of CeO2 is about 50nm. The surface
morphologies of the two groups of samples are examined by SEM.
Received: 10 October 2006
Revised: 31 January 2007
Published: 04 July 2007
Fund: Project supported by the 21st
Century Frontier R{\&}D Program of the Center for Applied
Superconductivity Technology, funded by the Ministry of Science and
Technology, Republic of Korea.
Cite this article:
Shi Dong-Qi, Ko Rock-Kil, Kim Ho-Sup, Chung Jun-Ki, Song Kyu-Jeongc, Park Chan, Ma Ping Research on CeO2 cap layer for YBCO-coated conductor 2007 Chin. Phys. 16 2142
