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Special Issue:
SPECIAL TOPIC — Fabrication and manipulation of the second-generation quantum systems
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| SPECIAL TOPIC — Fabrication and manipulation of the second-generation quantum systems |
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In situ non-destructive measurement of Josephson junction resistance using fritting contact technique |
| Lei Du(杜磊)1,2, Hao-Ran Tao(陶浩然)1,2, Liang-Liang Guo(郭亮亮)1,2, Hai-Feng Zhang(张海峰)1,2, Yong Chen(陈勇)1,2, Xin Tian(田昕)3, Chi Zhang(张驰)3, Zhi-Long Jia(贾志龙)3, Peng Duan(段鹏)1,2,†, and Guo-Ping Guo(郭国平)1,2,3,‡ |
1 CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China;
3 Origin Quantum Computing Technology (Hefei) Co., Ltd., Hefei 230088, China |
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Abstract Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films, making them unsuitable for frequency measurements of superconducting qubits. In this study, we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ, non-destructive measurements of Josephson junction resistance. Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz. Moreover, the fritting contact technique does not significantly affect qubit coherence time or the integrity of the superconducting film, confirming its non-destructive nature. This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues, thus supporting the advancement and practical deployment of superconducting quantum computing.
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Received: 22 July 2024
Revised: 26 August 2024
Accepted manuscript online: 27 August 2024
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PACS:
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03.67.Lx
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(Quantum computation architectures and implementations)
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03.67.-a
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(Quantum information)
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| Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 12034018 and 11625419). |
Corresponding Authors:
Peng Duan, Guo-Ping Guo
E-mail: pengduan@ustc.edu.cn;gpguo@ustc.edu.cn
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Cite this article:
Lei Du(杜磊), Hao-Ran Tao(陶浩然), Liang-Liang Guo(郭亮亮), Hai-Feng Zhang(张海峰), Yong Chen(陈勇), Xin Tian(田昕), Chi Zhang(张驰), Zhi-Long Jia(贾志龙), Peng Duan(段鹏), and Guo-Ping Guo(郭国平) In situ non-destructive measurement of Josephson junction resistance using fritting contact technique 2024 Chin. Phys. B 33 110309
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