The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode
Xu Chun-Kai(徐春凯)†, Wei Zheng(魏征), Chen Xiang-Jun(陈向军), and Xu Ke-Zun(徐克尊)
Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
Abstract In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 10$^{4}$ to 8 ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.
Received: 14 September 2006
Revised: 18 October 2006
Accepted manuscript online:
PACS:
68.37.Ef
(Scanning tunneling microscopy (including chemistry induced with STM))
Cite this article:
Xu Chun-Kai(徐春凯), Wei Zheng(魏征), Chen Xiang-Jun(陈向军), and Xu Ke-Zun(徐克尊) The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode 2007 Chinese Physics 16 2315
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